Reference switch architectures for noncontact sensing of substances

ABSTRACT

This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.15/751,095, filed Feb. 7, 2018, which is a National Phase PatentApplication under 35 U.S.C. § 371 of International Application No.PCT/US2016/049330, filed Aug. 29, 2016, which claims priority to U.S.Provisional Patent Application No. 62/213,004, filed Sep. 1, 2015, whichare hereby incorporated by reference in their entirety.

FIELD

This relates generally to a reference switch architecture capable ofdetecting one or more substances in a sample at a sampling interface,and more particularly, capable of reconstructing one or more opticalpaths in the sample.

BACKGROUND

Absorption spectroscopy is an analytical technique that can be used todetermine the concentration and type of substance in a sample at asampling interface. Conventional systems and methods for absorptionspectroscopy can include emitting light at the sample. As lighttransmits through the sample, a portion of the light energy can beabsorbed at one or more wavelengths. This absorption can cause a changein the properties of the light exiting the sample. The properties of thelight exiting the sample can be compared to the properties of the lightexiting a reference, and the concentration and type of substance in thesample can be determined based on this comparison.

Although the comparison can determine the concentration and type ofsubstance in the sample, the measurements and determination can beerroneous due to the inability to differentiate and compensate for straylight and fluctuations, drift, and variations early on, instead of aftera large number (e.g., tens or hundreds) of sample points are measured.Furthermore, some conventional systems and methods may not be capable ofmeasuring the concentration at multiple locations within the sample.Those systems and methods that can be capable of measuring theconcentration at multiple locations can require complicated componentsor detection schemes to associate the depths of the locations within thesample or path lengths of the light exiting the sample.

SUMMARY

This relates to systems and methods for measuring a concentration of asubstance in a sample when the concentration in the sample is low or theSNR is low (e.g., SNR<10⁻⁴ or 10⁻⁵). The systems and methods disclosedcan be capable of accounting for fluctuations, drift, and/or variationsoriginating from the light source, one or more optics, and the detectorin the system by sharing one or more components between the light pathfor measuring the sample optical properties and the light path formeasuring the reference optical properties. Additionally, the systemscan be capable of differentiating between different types of drift andcan be capable of eliminating erroneous measurements due to stray lightwith the placement of one or more modulators between the light sourceand the sample or reference. Furthermore, the systems can be capable ofdetecting the substance along various locations and depths within thesample by mapping a detector pixel in a detector array and a microopticsin a microoptics unit to the location and depth in the sample.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an exemplary system comprising multiple detectors formeasuring the concentration of a substance in a sample according toexamples of the disclosure.

FIG. 2 illustrates an exemplary process flow for measuring theconcentration and type of substance in a sample using a systemcomprising multiple detectors according to examples of the disclosure.

FIG. 3 illustrates an exemplary system comprising a shared detector formeasuring the concentration and type of substance in a sample accordingto examples of the disclosure.

FIG. 4 illustrates an exemplary process flow for measuring theconcentration and type of substance in a sample using a systemcomprising a shared detector according to examples of the disclosure.

FIG. 5 illustrates an exemplary plot of absorbance measurements fordetermining the concentration and type of substance according toexamples of the disclosure.

FIG. 6 illustrates an exemplary system comprising a modulator locatedbetween the light source and the sample for measuring the concentrationand type of substance in a sample according to examples of thedisclosure.

FIG. 7 illustrates an exemplary process flow for measuring theconcentration and type of substance in a sample using a systemcomprising a modulator located between the light source and the sampleaccording to examples of the disclosure.

FIG. 8 illustrates an exemplary system comprising a modulator locatedbetween the light source and the sample for measuring the concentrationand type of substance in a sample according to examples of thedisclosure.

FIG. 9 illustrates an exemplary process flow for measuring theconcentration and type of substance in a sample using a systemcomprising a modulator located between the light source and the sampleaccording to examples of the disclosure.

FIGS. 10A-10C illustrate exemplary plots of absorbance measurements usedfor determining the concentration and type of substance according toexamples of the disclosure.

FIG. 11 illustrates an exemplary process flow during a calibrationprocedure according to examples of the disclosure.

FIG. 12 illustrates an exemplary block diagram of an exemplary systemcapable reconstructing a plurality of optical paths originating fromdifferent locations within a sample and capable of resolving differentpath lengths of the plurality of optical paths according to examples ofthe disclosure.

FIG. 13 illustrates a cross-sectional view of an exemplary systemcapable of measuring different locations in the sample and capable ofresolving different light paths associated with the different locationsin the sample according to examples of the disclosure.

FIGS. 14A-14B illustrate cross-sectional views of exemplary systemsconfigured for determining a concentration and type of substance locatedin a sample using shared optics according to examples of the disclosure.

FIG. 15 illustrates a cross-sectional view of an exemplary systemconfigured for determining a concentration and type of substance locatedin a sample and configured to reduce or eliminate light reflections orscattering at the sample-system interface according to examples of thedisclosure.

FIG. 16A illustrates a cross-sectional view of an exemplary systemconfigured for determining a concentration and type of substance locatedin a sample according to examples of the disclosure.

FIG. 16B illustrates a cross-sectional view of an exemplary polarizationsensitive system according to examples of the disclosure.

FIG. 17 illustrates a cross-sectional view of an exemplary systemconfigured for determining a concentration and type of substance in asample according to examples of the disclosure.

FIGS. 18-19 illustrate top views of a surface of exemplary systemsconfigured for determining a concentration and type of substance locatedin a sample according to examples of the disclosure.

DETAILED DESCRIPTION

In the following description of examples, reference is made to theaccompanying drawings in which it is shown by way of illustrationspecific examples that can be practiced. It is to be understood thatother examples can be used and structural changes can be made withoutdeparting from the scope of the various examples.

Representative applications of methods and apparatus according to thepresent disclosure are described in this section. These examples arebeing provided solely to add context and aid in the understanding of thedescribed examples. It will thus be apparent to one skilled in the artthat the described examples may be practiced without some or all of thespecific details. Other applications are possible, such that thefollowing examples should not be taken as limiting.

Various techniques and process flow steps will be described in detailwith reference to examples as illustrated in the accompanying drawings.In the following description, numerous specific details are set forth inorder to provide a thorough understanding of one or more aspects and/orfeatures described or referenced herein. It will be apparent, however,to one skilled in the art, that one or more aspects and/or featuresdescribed or referenced herein may be practiced without some or all ofthese specific details. In other instances, well-known process stepsand/or structures have not been described in detail in order to notobscure some of the aspects and/or features described or referencedherein.

Further, although process steps or method steps can be described in asequential order, such processes and methods can be configured to workin any suitable order. In other words, any sequence or order of stepsthat can be described in the disclosure does not, in and of itself,indicate a requirement that the steps be performed in that order.Further, some steps may be performed simultaneously despite beingdescribed or implied as occurring non-simultaneously (e.g., because onestep is described after the other step). Moreover, the illustration of aprocess by its depiction in a drawing does not imply that theillustrated process is exclusive of other variations and modificationthereto, does not imply that the illustrated process or any of its stepsare necessary to one or more of the examples, and does not imply thatthe illustrated process is preferred.

This disclosure relates to systems and methods for measuring aconcentration and type of substance in a sample at a sampling interface.In some examples, the concentration in the sample can be low, or the SNRcan be low (e.g., SNR<10⁴ or 10⁻⁵). The systems can include a lightsource, optics, one or more modulators, a reference, a detector, and acontroller (or logic). The systems and methods disclosed can be capableof accounting for fluctuations, drift, and/or variations originatingfrom the light source, one or more optics, and the detector by sharingone or more components between the light path for measuring the sampleoptical properties and the light path for measuring the referenceoptical properties. Additionally, the systems can be capable ofdifferentiating between different types of drift and can be capable ofeliminating erroneous measurements due to stray light with the placementof one or more modulators between the light source and the sample orreference. Furthermore, the systems can be capable of detecting thesubstance along various locations and depths within the sample bymapping a detector pixel in a detector array and a microoptics in amicrooptics unit to the location and depth in the sample.

For substances in a sample, each substance can have a signature in acertain wavelength regime, indicated by the location of one or moreabsorbance peaks. One exemplary wavelength regime can beshort-wavelength infrared (SWIR). A substance can absorb higher amountsof energy at one or more wavelengths and can absorb lower amounts ofenergy at other wavelengths, forming a spectral fingerprint unique tothe substance. The determination of the type of substance in the samplecan be performed by matching the pattern of the one or more absorbancepeaks to this spectral fingerprint. Additionally, the concentration ofthe substance can be based on the amount of absorption.

The sample at a sampling interface can comprise multiple substances thatcan modify light incident. Of the multiple substances, one or moresubstances can be a substance of interest and other substances may notbe of interest. In some examples, the substances not of interest canabsorb more incident light than the substance of interest. Additionally,spectral artifacts can “mask” the absorbance peaks of the one or moresubstances of interest. Both the spectral artifacts and the absorptionof substances not of interest can make detection of the substance ofinterest difficult. Furthermore, there can be an inhomogeneousdistribution of the one or more substances in the sample, which canproduce variations in the optical properties (e.g., linearbirefringence, optical activity, diattenuation) of the sample.

Absorption spectroscopy is an analytical technique that can be used todetermine the concentration and type of substance in a sample. Light canhave an initial intensity or energy when emitted from a light source andincident on a sample. As the light is transmitted through the sample, aportion of the energy can be absorbed at one or more wavelengths. Thisabsorption can cause a change (e.g., loss) in the intensity of the lightexiting the sample. As the concentration of the substance in the sampleincreases, a higher amount of energy can be absorbed, and this can berepresented by the measured absorbance as:A=2−log(T)  (1)where T is the transmittance of the light exiting the sample.

The amount of light exiting the sample after being at least partiallyabsorbed by a substance can decrease exponentially as the concentrationof the substance in the sample increases. Given the relationship betweenabsorbance and transmittance stated in Equation 1, a linear relationshipcan exist between absorbance and the concentration of the substance inthe sample. With this relationship, the concentration of the substancein the sample can be calculated using a reference and a proportionalequation, defined as:

$\begin{matrix}{\frac{A_{sample}}{A_{reference}} = \frac{C_{sample}}{C_{reference}}} & (2)\end{matrix}$where A_(sample) and A_(reference) are the sample absorbance andreference absorbance, respectively, and C_(sample) and C_(reference) arethe concentrations of the substance in the sample and in the reference,respectively. In some examples, the substance can include one or morechemical constituents, and the measurement can be used to determine theconcentration of each chemical constituent present in the sample.

FIG. 1 illustrates an exemplary system and FIG. 2 illustrates anexemplary process flow for measuring the concentration of a substance ina sample using a system comprising multiple detectors according toexamples of the disclosure. System 100 can include light source 102controlled by controller 140 through signal 104. Light source 102 canemit multi-band or multi-wavelength light 150 towards monochromator 106(step 202 of process 200). A monochromator is a component that canselect one or more discrete wavelengths from multi-wavelength light 150.In some examples, monochromator 106 can comprise an entrance slitconfigured to exclude unwanted or stray light. The monochromator can becoupled with one or more interference or absorption filters, prisms, ordiffraction gratings for wavelength selection. Monochromator 106 canseparate light 150 into one or more discrete wavelengths forming light152 (step 204 of process 200). Light 152 can be incident on beamsplitter110. A beamsplitter is an optical component that can split a beam oflight into multiple beams of light. Here, beamsplitter 110 can splitlight 152 into two light beams: light 154 and light 164 (step 206 ofprocess 200).

Light 154 can be incident on sample 120. A portion of light can beabsorbed by the substance in sample 120, and a portion of light cantransmit through sample 120 (step 208 of process 200). The portion oflight that transmits through sample 120 can be represented as light 156.Light 156 can comprise a set of photons that can impinge upon the activearea of detector 130. Detector 130 can respond to or measure light orphotons impinging on the active area (step 210 of process 200) and cangenerate electrical signal 158, which can be indicative of theproperties of light 156 (step 212 of process 200). Electrical signal 158can be input into controller 140.

Light 164 can be directed towards mirror 112 (step 214 of process 200).Mirror 112 can be any type of optics capable of directing or redirectinglight towards reference 122. In some examples, the system can,additionally or alternatively, include, but is not limited to,non-reflective component(s) (e.g., curved waveguide) for lightredirection. In some examples, system 100 can include other types ofoptics such as light guides, diffraction gratings, or a reflectanceplate. Light 164 can be incident on reference 122. A portion of light164 can be absorbed by the substance in reference 122, and a portion oflight 164 can transmit through reference 122 as light 166 (step 216 ofprocess 200). Light 166 can comprise a set of photons that can impingeupon the active area of detector 132. In some examples, detector 130 anddetector 132 can be matched detectors. That is, detector 130 anddetector 132 can have similar characteristics including, but not limitedto, the type of detector, the operating conditions, and performance.Detector 132 can respond to or measure light or photons impinging on theactive area (step 218 of process 200) and can generate an electricalsignal 168 indicative of the properties of light 166 (step 220 ofprocess 200). Electrical signal 168 can be input into controller 140.

Controller 140 can receive both signal 158 and signal 168. In someexamples, signal 158 can include the sample absorbance (indicated asA_(sample) in Equation 2), and signal 168 can include the referenceabsorbance (indicated as A_(reference) in Equation 2). Controller 140can divide the sample absorbance by the reference absorbance to obtain aratio. The concentration of the substance in reference 122 can be apre-determined or known value. Thus, controller 140 can use the ratio ofthe sample and reference absorbance and the known concentration of thesubstance in the reference to determine the concentration of thesubstance in the sample (step 222 of process 200).

One advantage to determining the composition of the substance in thesample using system 100 (illustrated in FIG. 1 ) can be thatfluctuations, drift, and/or variations originating from the lightsource, and not originating from changes in the composition of thesubstance, can be compensated. For example, if the properties of light152 emitted from light source 102 unexpectedly change, both light 154and light 164 can be equally affected by this unexpected change. As aresult, both light 156 and light 166 can also be equally affected suchthat the change in light can be canceled when controller 140 dividessignal 158 by signal 168. However, since system 100 includes twodifferent detectors (e.g., detector 130 and detector 132) for theabsorbance measurements, fluctuations, drift, and/or variationsoriginating from the detectors themselves may not be compensated.Although detector 130 and detector 132 can be matched (i.e., have thesame characteristics), the rate or effect that various factors unrelatedto the substance, such as environmental conditions, can have on thedifferent detectors may not be the same. One skilled in the art wouldappreciate that the same characteristics can include tolerances thatresult in a 15% deviation. With differing effects to the differentdetectors, only one signal, and not both signals, can be perturbed.Instead of controller 140 realizing that there is a factor unrelated tothe substance that has perturbed only one signal, controller 140 canerroneous calculate this perturbation as a difference in theconcentration of sample 120 compared to the reference 122. Alternativelyor additionally, controller 140 can mistake the type of substance if theperturbation leads to change in the spectral fingerprint.

There can be many sources of fluctuations, drift, and variations. Oneexemplary drift can be an initialization drift due to “warming up” thecomponents. While the user can wait a certain time until suchinitialization drift has stabilized, this may not be a suitable solutionin certain applications. For example, in systems where low powerconsumption is desired, certain components can be turned off when not inuse to conserve power and then switched on when in use. Waiting for thecomponents to warm up may become frustrating for the user depending onhow long it would take for stabilization. Furthermore, the powerconsumed while waiting may consume power such that the benefit ofturning off the components may be negated. Another exemplary drift canbe due to noise. For example, 1/f noise can be present due to randomlychanging non-ohmic contacts of the electrodes and/or influences fromsurface state traps within a component. With random changes, not onlyare the changes unpredictable, but also may affect the differentdetectors in a different manner Another exemplary drift can be thermaldrift due to variations in temperature and/or humidity of the ambientenvironment, which may also affect the different detectors in adifferent manner.

Regardless of the source of the fluctuations, drift, and variations, theeffect of having a detector measure the sample and a different detectormeasure the reference can lead to an unwanted change in the sensitivity,detectivity, and/or absorbance spectrum. Since the light path travelingthrough the sample can be different from the light path travelingthrough the reference and there can be many non-shared components orunmapped correlations between the two paths, any change in signal due tomismatch between the light paths may not be differentiated from thechange in signal due to the substance of interest.

Since light source 102 in system 100 can be shared, drift andinstabilities originating from light source 102 can be compensated for.However, drift or instabilities originating from components that are notshared (i.e., not common) along both light paths may not be compensatedfor. Moreover, the measurement capabilities of the system can be limitedin situations where the detectors are shot noise limited. Shot noise isthe noise or current generated from random generation and flow of mobilecharge carriers. With shot noise limited detectors, the differentdetectors can have random and/or different noise floors. As a result,system 100 (illustrated in FIG. 1 ) may not be suitable for highsensitivity or low signal measurements.

FIG. 3 illustrates an exemplary system and FIG. 4 illustrates anexemplary process flow for measuring the concentration and type ofsubstance in a sample using a system comprising a shared detectoraccording to examples of the disclosure. System 300 can include lightsource 302 controlled by controller 340 through signal 304. Light source302 can emit multi-wavelength light 350 towards monochromator 306 (step402 of process 400). Monochromator 306 can separate multi-wavelengthlight 350 into one or more discrete wavelengths of light comprisinglight 352 (step 404 of process 400). Light 352 can be directed towardsbeamsplitter 310, which can then split light into two light beams: light354 and light 364 (step 406 of process 400).

Light 354 can be incident on sample 320. A portion of light can beabsorbed by the substance in sample 320, and a portion of light cantransmit through sample 320 (step 408 of process 400). The portion oflight that transmits through the sample can be referred to as light 356.Light 356 can be directed towards mirror 314. Mirror 314 can change thedirection of propagation of light 356 toward selector 324 (step 410 ofprocess 400).

Light 364 can be incident on mirror 312. Mirror 312 can change thedirection of propagation of light towards reference 322 (step 412 ofprocess 400). A portion of light 364 can be absorbed by the chemicalsubstance in reference 322, and a portion of light 364 can transmitthrough reference 322 (step 414 of process 400). The portion of lightthat transmits through reference 322 can be referred to as light 366.

Both light 356 and 366 can be incident on selector 324. Selector 324 canbe any optical component capable of moving or selecting the light beamto direct towards the chopper 334. Chopper 334 can be a component thatperiodically interrupts the light beam. System 300 can alternate in timebetween chopper 334 modulating light 356 and modulating light 366. Lighttransmitting through chopper 334 can be incident on the active area ofdetector 330. Both light 356 and light 366 can each comprise a set ofphotons that impinge upon the active area of detector 330. Detector 330can respond to or measure light or photons impinging on the active areaand can generate an electrical signal indicative of the properties oflight.

In a first time, chopper 334 can modulate light 356 (step 416 of process400). Detector 330 can measure light 356 that has transmitted throughthe sample 320 (step 418 of process 400) and can generate an electricalsignal 358 indicative of the properties of light 356 (step 420 ofprocess 400). In a second time, chopper 334 can modulate light 366 (step422 of process 400). Detector 330 can measure light 366 that hastransmitted through reference 322 (step 424 of process 400) and cangenerate an electrical signal 368 indicative of the properties of light366 (step 426 of process 400).

Controller 340 can receive both signal 358 and signal 368 at differenttimes. Signal 358 can include the sample absorbance A_(sample), andsignal 368 can include the reference absorbance A_(reference).Controller 340 can divide the sample absorbance A_(sample) by thereference absorbance A_(reference) (step 428 of process 400) to obtain aratio. The concentration of the substance in the reference 322 can be apre-determined or known value. Using the ratio of the sample absorbanceand the reference absorbance and the concentration of the substance inreference 322, Equation 2 can be used to determine the concentration ofthe substance in sample 320.

Although system 300 (illustrated in FIG. 3 ) can compensate for minorfluctuations, drifts, and/or variations in the detector due to theshared detector, it may be difficult to discern between different typesof drift. There can be multiple types of drift, such as zero drift andgain drift. Zero drift refers to a change in the zero level over time,thereby preventing a constant (horizontal) relationship with time. Gaindrift refers to a change in the average number of electronic carriersper generated electron-hole pair. That is, gain drift refers to a changein the efficiency or ratio of generated electron-hole pairs to thecurrent response of the detector. In order to discern between the zerodrift and the gain drift, the system should be capable of stabilizingone type of drift and then measuring the other. For example, todetermine the gain drift from the light source, the system should be DCstabilized (i.e., a stable zero drift). However, due to lack ofcapability for stabilizing one type of drift in system 300, in someinstances, it may be difficult to discern between zero drift and gaindrift.

In some instances, the presence of stray light that can be measured bythe detector can lead to an erroneous signal and an erroneousdetermination of the concentration or type of substance. In system 300,the placement of chopper 334 after light has transmitted through sample320 or reference 322 can lead to the stray light reaching sample 320 orreference 322. The stray light may not contribute to the spectroscopicsignal, so by allowing the stray light to reach sample 320 or reference322, the photons included in the stray can be detected by detector 330.The photons from the stray light impinging on the active area ofdetector 330 can lead to erroneous changes in either signal 358 orsignal 368. With a change in signal 358 or signal 368, controller 340may not be able to determine whether or how much this change is due tostray light or due to variations in light source 302. Therefore, system300 may not be suitable for situations where there can be non-negligibleamounts of stray light present.

When there is a low concentration of the substance of interest in thesample, a system with increased accuracy and sensitivity, compared tosystem 100 (illustrated in FIG. 1 ) and system 300 (illustrated in FIG.3 ), may be desired. To measure the concentration of a substance, system100 (illustrated in FIG. 1 ) and system 300 (illustrated in FIG. 3 ) canmeasure the sample and reference multiple times. FIG. 5 illustrates anexemplary plot of the absorbance measurements for determining theconcentration and type of substance according to examples of thedisclosure. The system can begin with calibration phase 570, where oneor more components in the system can be optimized, calibrated, and/orsynchronized to minimize errors. Calibration phase 570 can include, forexample, only measuring the reference absorbance. Alternatively, asample with a known, stable concentration of the substance can be placedin the light path where the sample is located. The system can be eitheron or off. The controller can determine the absorbance and set the “zerolevel” equal to this absorbance. If the signal has saturated or clippeddue to a significant drift, the controller can adjust the light sourceemission properties until the signal is no longer saturated.

Once calibration phase 570 is complete and the zero level has beendetermined, the system can proceed to measurement phase 572. Inmeasurement phase 572, the concentration of the substance in the samplecan be measured by sampling several times to generate a plurality ofsample points 574. In some examples, the system can measure tens tohundreds of sample points 574. Once a certain number of sample points574 have been obtained, the controller can average the values of thesample points 574 to determine the absorbance. Obtaining multiple samplepoints and determining the average may be needed because, as illustratedin the figure, the absorbance measurements can include minorperturbations that, if not accounted for, can lead to errors in thedetermination of the concentration of the substance. In some examples,calibration phase 570 can be repeated to re-zero the zero level when thelight source changes emission wavelength, after a pre-determined timehas elapsed between consecutive calibration phases, or after apre-determined number of sample points have been measured.

In some instances, the measurement procedure illustrated in FIG. 5 canhave long times between consecutive calibration phases, which can leadto inaccurate average signal measurements due to the set zero leveldrifting from the actual zero level. The figure illustrates the zerodrift or gain drift, where the absorbance signal can start to deviatefrom a constant (or horizontal) relationship with time due to the zerolevel or gain level drifting away from the actual zero level or actualgain level, respectively. While the time between consecutive calibrationphases can be shortened, there can be a limit on the minimum time periodbetween calibration phases due to the minimum number of sample pointsthat may be needed in order for the average of the sample point valuesto be an accurate indication of the concentration of the substance inthe sample. This can be particularly true in situations where the SNR islow, which can require tens to hundreds of repeated measurements inorder to achieve an average absorbance value that is somewhat accurate.

FIG. 6 illustrates an exemplary system and FIG. 7 illustrates anexemplary process flow for measuring the concentration of a substance ina sample using a system comprising a modulator located between the lightsource and the sample according to examples of the disclosure. System600 can include light source 602 coupled to controller 640. Controller640 can send signal 604 to light source 602. In some examples, signal604 can include a current or voltage waveform. Light source 602 can bedirected towards filter 606, and signal 604 can cause light source 602to emit light 650 towards filter 606 (step 702 of process 700). Lightsource 602 can be any source capable of generating light including, butnot limited to, a lamp, a laser, a light emitting diode (LED), anorganic LED (OLED), an electroluminescent (EL) source, asuper-luminescent diode, any super-continuum source including afiber-based source, or a combination of one or more of these sources. Insome examples, light source 602 can be capable of emitting a singlewavelength of light. In some examples, light source 602 can be capableof emitting a plurality of wavelengths of light. In some examples, theplurality of wavelengths can be close to or adjacent to one anotherproviding a continuous output band. In some examples, light source 602can be a super-continuum source capable of emitting light in at least aportion of both the SWIR and MWIR ranges. A super-continuum source canbe any broadband light source that outputs a plurality of wavelengths.In some examples, light source 602 can be any tunable source capable ofgenerating a SWIR signature.

Filter 606 can be any type of filter that is capable of tuning orselecting a single wavelength or multiple discrete wavelengths by tuningthe drive frequency. In some examples, filter 606 can be anacousto-optic tunable filter (AOTF). In some examples, filter 606 can bean angle tunable narrow bandpass filter. Although not illustrated in thefigure, filter 606 can be coupled to controller 640, and controller 640can tune the drive frequency of filter 606. In some examples, filter 606can be a transmit band filter configured to selectively allow one ormore continuous bands (i.e., wavelength ranges) of light to transmitthrough. Light 650 can comprise multiple wavelengths (step 702 ofprocess 700) and after transmitting through filter 606, can form light652 comprising one or more discrete wavelengths (step 704 of process700). In some examples, light 652 comprises fewer wavelength of lightthan light 650. Light 652 can be directed towards beamsplitter 610.Beamsplitter 610 can be any type of optic capable of splitting incominglight into multiple light beams. In some examples, each light beam splitby the beamsplitter 610 can have the same optical properties. Oneskilled in the art would appreciate that the same optical properties caninclude tolerances that result in a 15% deviation. Beamsplitter 610 cansplit light 652 into two light beams (step 706 of process 700): light654 and light 664, as illustrated in the figure.

Light 654 can transmit through chopper 634, where chopper 634 canmodulate the intensity of light 654 (step 708 of process 700). Chopper634 can be any component capable of modulating the incoming light beam.In some examples, chopper 634 can be an optical chopper. In someexamples, chopper 634 can be a mechanical shutter. In some examples,chopper 634 can be a modulator or a switch. Light 654 can transmitthrough optics 616 (step 710 of process 700). Optics 616 can include oneor more components configured for changing the behavior and properties,such as the beam spot size and/or angle of propagation, of light 654.Optics 616 can include, but are not limited to, a lens or lensarrangement, beam directing element, collimating or focusing element,diffractive optic, prism, filter, diffuser, and light guide. Optics 616can be placed in any arrangement such as a resolved path sampling (RPS)system, confocal system, or any optical system suitable for measuring aconcentration and type of substance in sample 620. The optical can be anoptical system capable of resolving multiple angles of incidence on asample surface and different path lengths of a plurality of opticalpaths. In some examples, the optical system configured for accepting oneor more incident light rays with a path length within a range of pathlengths and an angle of incidence within a range of angles, andrejecting optical paths with a path length outside the range of pathlengths and with an angle of incidence outside the range of angles.

Light 654 can transmit through sample 620. Energy can be absorbed at oneor more wavelengths by the substance in the sample 620, causing a changein the properties of light 656 exiting the sample (step 712 of process700). In some examples, light 656 can be formed by reflection orscattering of the substance located in the sample. Light 656 can beincident on mirror 614, which can redirect light 656 towards selector624 (step 714 of process 700). Mirror 614 can be any type of opticscapable of changing the direction or angle of propagation of light. Forexample, mirror 614 can be a concave mirror. In some examples, thesystem can, additionally or alternatively, include, but is not limitedto, non-reflective component(s) (e.g., curved waveguide) for lightredirection.

Light 664 can be incident on mirror 612 (step 716 of process 700).Mirror 612 can redirect light 664 towards detector 630. Mirror 612 canbe any mirror capable of changing the direction or angle of propagationof light. In some examples, mirror 612 can have the same opticalproperties as mirror 614. Light 664 can transmit through chopper 636,which can modulate the intensity of light 664 (step 718 of process 700).In some examples, chopper 634 and chopper 636 can have the same choppercharacteristics, such as chopping frequency and disc configuration. Oneskilled in the art would appreciate that the same choppercharacteristics can include tolerances that result in a 15% deviation.In some examples, chopper 636 can be a shutter, such as amicroelectromechanical (MEMS) shutter. In some examples, chopper 636 canbe a modulator or a switch. The modulated light can transmit throughfilter 608 to generate light 666 (step 720 of process 700). Filter 608can be any type of filter capable of selectively transmitting light. Insome examples, filter 608 can be a neutral density filter, blankattenuator, or filter configured for attenuating or reducing theintensity of all wavelengths of light. In some examples, filter 608 canattenuate light by a pre-determined or known constant value orattenuation factor.

Both light 656 and light 666 can be incident on selector 624. Selector624 can be any optical component capable of moving or selecting thelight beam to direct towards detector 630. System 600 can alternate intime between allowing light 656 to be incident on the active area ofdetector 630 at one time and allowing light 666 to be incident on theactive area of detector 630 at another time. In both situations, light656 and light 666 can each include a set of photons. The photons canimpinge on the active area of detector 630, and detector 630 cangenerate an electrical signal indicative of the properties of theincident light or number of impinging photons. Detector 630 can measurethe set of photons from light 656 impinging on its active area (step 722of process 700) and can generate an electrical signal 658 (step 724 ofprocess 700). Signal 658 can be indicative of the properties of light656, which can represent the energy from light 654 that is not absorbedby the substance of interest. Detector 630 can measure the set ofphotons from light 666 impinging on its active area (step 726 of process700) and can generate an electrical signal 668 (step 728 of process700). Signal 668 can be indicative of the properties of light 664 thatwas not absorbed by filter 608 and can act as a reference.

Detector 630 can be any type of detector capable of measuring orresponding to light or photons, such as photodiodes, photoconductors,bolometers, pyroelectric detectors, charge coupled devices (CCDs),thermocouples, thermistors, photovoltaics, and photomultiplier tubes.Detector 630 can include a single detector pixel or a detector array,such as a multi-band detector or a focal plane array (FPA). A detectorarray can include one or more detector pixels disposed on a substrate. Adetector pixel can include one or more detector elements with a commonfootprint. A detector element can be an element designed to detect thepresence of light and can individually generate a signal representativeof the detected light. In some examples, detector 630 can be any type ofdetector capable of detecting light in the SWIR. Exemplary SWIRdetectors can include, but are not limited to, Mercury Cadmium Telluride(HgCdTe), Indium Antimonide (InSb), and Indium Gallium Arsenide(InGaAs). In some examples, detector 630 can be a SWIR detector capableof operating in the extended wavelength range (up to 2.7 μm).

Controller 640 can receive both signal 658 and signal 668, where eachsignal can be received at a different time. Signal 658 can include thesample absorbance A_(sample), and signal 668 can include the referenceabsorbance A_(reference). Controller 640 can divide (or subtract) thesample absorbance A_(sample) by the reference absorbance A_(reference)(step 730 of process 700) to obtain a ratio. The amount of reduction inintensity produced by filter 608 can be a pre-determined or known valueor attenuation factor. Using the ratio of the sample absorbance and thereference absorbance and the attenuation factor for filter 608, Equation2 can be used to determine the concentration of the substance ofinterest in sample 620. In some examples, controller 640 can compare thereference absorbance to one or more absorbance values stored in a lookuptable or in memory to determine the concentration and type of substancein the sample. Although Equation 2 and the above discussion is providedthe context of absorbance, examples of the disclosure include, but arenot limited to, any optical property such as reflectivity, refractiveindex, density, concentration, scattering coefficient, and scatteringanisotropy.

System 600 can be an alternative to system 100 (illustrated in FIG. 1 )and system 300 (illustrated in FIG. 3 ). System 600 can have a shareddetector (e.g., detector 630) to measure light through sample 620 andfilter 608. Utilizing a shared detector can eliminate or alleviateunpredictable changes in sensitivity, detectivity, and/or absorbance dueto differing (or random) fluctuations, drifts, and/or variations. Asdiscussed above, the fluctuations, drifts, and/or variations can be dueto initialization, 1/f noise, and/or environmental changes that canaffect the two detectors in a different manner Additionally, system 600can tolerate and discern non-negligible amounts of stray light due tothe placement of chopper 634 and chopper 636 in the light path prior tobeing incident on sample 620 and filter 608, respectively. Furthermore,unlike system 100 and system 300, system 600 can account for anyfluctuations, drifts, and/or variations originating from both lightsource 602 and detector 630.

In some examples, attenuation of incoming light by filter 608 by apre-determined or known constant value can lead to a mismatch betweenlight 656 (i.e., light that transmits through sample 620) and light 666(i.e., light that transmits through filter 608). This mismatch can bedue to differing absorbance at different wavelengths. At one or morewavelengths, the substance in sample 620 can absorb a large percentageof light, and therefore, a low attenuation factor for filter 608 wouldbe suitable at those one or more wavelengths. At other wavelengths, thesame substance and same concentration of that substance in sample 620can absorb very little light, and therefore, a high attenuation factorfor filter 608 would be suitable. Since filter 608 can attenuate by aconstant value for all wavelengths of interest, accurate measurements ofsystem 600 can be limited to only one or a small number of wavelengths.Furthermore, a blank attenuator or neutral density filter may not beeffective when detecting a low concentration of the substance ofinterest in the sample if the attenuation factor is not optimal.Therefore, a system that can account for the variations in absorbancewith wavelength in sample 620 and can be capable of detecting a lowconcentration of the substance in the sample may be desired.

FIG. 8 illustrates an exemplary system and FIG. 9 illustrates anexemplary process flow for measuring the concentration of a substance ina sample using a system comprising a modulator located between the lightsource and the sample according to examples of the disclosure. System800 can include light source 802 coupled to controller 840. Controller840 can send signal 804 to light source 802. In some examples, signal804 can include a current or voltage waveform. Light source 802 can bedirected towards filter 806, and signal 804 can cause light source 802to emit light 850 (step 902 of process 900). Light source 802 can be anysource capable of emitting light 850. In some examples, light source 802can be capable of emitting a single wavelength of light. In someexamples, light source 802 can be capable of emitting a plurality ofwavelengths of light. An exemplary light source can include, but is notlimited to, a lamp, laser, LED, OLED, EL source, super-luminescentdiode, super-continuum source, fiber-based source, or a combination ofone or more of these sources. In some examples, the plurality ofwavelengths can be close to or adjacent to one another providing acontinuous output band. In some examples, light source 802 can be anytunable source capable of generating a SWIR signature. In some examples,light source 802 can be a super-continuum capable of emitting light atleast in a portion of both the SWIR and MWIR.

Filter 806 can be any filter capable of tuning and selecting a singlewavelength or multiple discrete wavelengths by tuning the drivefrequency. In some examples, filter 806 can be an AOTF. In someexamples, filter 606 can be an angle tunable narrow bandpass filter.Although not illustrated in the figure, filter 806 can be coupled tocontroller 840, and controller 840 can tune the drive frequency offilter 806. In some examples, filter 806 can be a transmit band filterconfigured to selectively allow one or more continuous bands (i.e.,wavelength ranges) of light to transmit through. Light 850 can comprisemultiple wavelengths and, after transmitting through filter 806, canform light 852 comprising one or more discrete wavelengths (step 904 ofprocess 900). In some examples, light 852 comprises fewer wavelengths oflight than light 850. Light 852 can be directed towards a beamsplitter810. Beamsplitter 810 can be any type of optic capable of splittingincoming light into multiple light beams. In some examples, each lightbeam split by beamsplitter 810 can have the same optical properties. Oneskilled in the art would appreciate that the same optical properties caninclude tolerances that result in a 15% deviation. As illustrated in thefigure, beamsplitter 810 can split light 852 into two light beams: light854 and light 864 (step 906 of process 900).

Light 854 can transmit through chopper 834, where chopper 834 canmodulate the intensity of light 854 (step 908 of process 900). Chopper834 can be any component capable of modulating or periodicallyinterrupting the incoming light beam. In some examples, chopper 834 canbe an optical chopper. In some examples, chopper 834 can be a mechanicalshutter, such as a MEMS shutter. In some examples, chopper 834 can be amodulator or a switch. Light 854 can transmit through optics 816 (step910 of process 900). Optics 816 can include one or more componentsconfigured for changing the behavior and properties, such as the beamspot size and/or angle of propagation, of light 854. Optics 816 caninclude, but are not limited to, a lens or lens arrangement, beamdirecting element, collimating or focusing element, diffractive optic,prism, filter, diffuser, and light guide. Optics 816 can include anytype of optical system, such as a RPS system, confocal system, or anyoptical system suitable for measuring a concentration and type ofsubstance in sample 820.

Light 854 can be directed towards sample 820. Sample 820 can absorb aportion of light 854 and can transmit a portion of light 854 at one ormore wavelengths (step 912 of process 900). A portion of light 854 canbe absorbed by the substance in sample 820, and a portion of light 854can transmit through the sample 820. The portion of light 854 thattransmits through the sample 820 can be referred to as light 856. Insome examples, light 856 can be formed by reflection or scattering ofthe substance located in sample 820. Light 856 can be directed towardsmirror 814, and mirror 814 can redirect light 856 towards mirror 814(step 914 of process 900). Mirror 814 can be any type of optics capableof changing the direction of light propagation. In some examples, mirror814 can be a concave mirror configured to change the direction of lightpropagation by 90°. In some examples, the system can, additionally oralternatively, include, but is not limited to, non-reflectivecomponent(s) (e.g., curved waveguide) for light redirection.

The second light path formed by the beamsplitter 810 splitting light 852can be referred to as light 864. Light 864 can be directed towardsmirror 812. Mirror 812 can be any type of optics capable of changing thedirection of the propagation of light 864. Mirror 812 can redirect light864 towards selector 824 (step 916 of process 900) by changing itsdirection of propagation by 90°. In some examples, the system can,additionally or alternatively, include, but is not limited to,non-reflective component(s) (e.g., curved waveguide) for lightredirection.

Light 864 can transmit through chopper 836, and chopper 836 can modulatelight 864 (step 918 of process 900). Chopper 836 can be any componentcapable of modulating the intensity of the incoming light beam. In someexamples, chopper 834 and chopper 836 can have the same choppingcharacteristics, such as chopping frequency and disc configuration. Oneskilled in the art would appreciate that the same choppingcharacteristics can include tolerances that result in a 15% deviation.In some examples, chopper 836 can be a mechanical shutter, such as aMEMS shutter. In some examples, chopper 834 can be an optical modulatoror a switch. Light 864 can transmit through optics 818 (step 920 ofprocess 900). Optics 818 can include one or more lenses, beam directingelements, collimating or focusing elements, diffractive optics, prisms,filters, diffusers, light guides, or a combination of one or more theseoptical elements and can be arranged in any arrangement (e.g., RPSsystem or confocal system) suitable for measuring a concentration andtype of substance in sample 820 or reference 822. In some examples,optics 818 can have the same components, arrangement, and/orcharacteristics as optics 816.

Light exiting optics 818 can be incident on reference 822 (step 922 ofprocess 900). Reference 822 can have one or more known spectroscopicproperties (e.g., scattering characteristics, reflectioncharacteristics, or both) that may be selected to match thespectroscopic properties of an intended sample. For example, reference822 can have one or more spectroscopic properties that match thespectroscopic properties of skin tissue. In some examples, reference 822can be a copy or a “phantom” replica of sample 820. In some examples,the absorption spectra of reference 822 can be the same as theabsorption spectra of sample 820. One skilled in the art wouldappreciate that the same absorption spectra can include tolerances thatresult in a 15% deviation. A portion of light can be absorbed byreference 822, and a portion of light can transmit through reference822, forming light 866. After transmitting through reference 822, light866 can be directed towards selector 824.

Selector 824 can be any optical component capable of moving or selectingthe light beam to direct towards detector 830. In some examples,selector 824 can be coupled to controller 840, and controller 840 cansend a signal (not shown) to control the movement of selector 824. Inone time, selector 824 can allow light 856 to be incident on the activearea of detector 830. Light 856 can comprise a set of photons, anddetector 830 can measure the number of photons in light 856 (step 924 ofprocess 900). Detector 830 can generate an electrical signal 858indicative of the properties (or the number of photons) of light 856(step 926 of process 900). Signal 858 can be sent to controller 840,which can store and/or process the signal. In another time, selector 824can allow light 866 to be incident on the active area of detector 830.Light 866 can also comprise a set of photons, and detector 830 canmeasure the number of photons in light 866 (step 928 of process 900).Detector 830 can generate an electrical signal 868 indicative of theproperties (or the number of photons) of light 866 (step 930 of process900). Signal 868 can be sent to controller 840, which can store and/orprocess the measured signal.

Detector 830 can include single detector pixel or a detector array. Insome examples, detector 830 can be any type of detector capable ofdetecting light in the SWIR. In some examples, detector 830 can be aHgCdTe, InSb, or InGaAs single detector or a FPA. In some examples,detector 830 can be a SWIR detector capable of operating in the extendedwavelength range of up to 2.7 μm.

Controller 840 can receive both signal 858 and signal 868, but atdifferent times. Signal 858 can include the sample absorbanceA_(sample), and signal 868 can include the reference absorbanceA_(reference). In some examples, controller 840 can divide (or subtract)the sample absorbance A_(sample) by the reference absorbanceA_(reference) to determine the concentration of the substance ofinterest in sample 820 (step 932 of process 900). In some examples,controller 840 can compare the reference absorbance to one or moreabsorbance values stored in a lookup table or in memory to determine theconcentration and type of substance in sample 820. In some examples,signal 858 can differ from signal 868 by the amount of drift from lightsource 802, detector 830 or both. The controller 840 can divide (orsubtract) signal 858 by signal 868 to determine the amount of drift.Although Equation 2 and the above discussion are provided in the contextof absorbance, examples of the disclosure include, but are not limitedto, any optical property, such as reflectivity, refractive index,density, concentration, scattering coefficient, and scatteringanisotropy.

System 800 can include all of the advantages of system 600 while alsoaccounting for variations in the absorbance of sample 820 withwavelength. Although the systems disclosed above illustrate one or morecomponents, such as choppers, optics, mirrors, sample, light source,filters, and detector, one of ordinary skill in the art would understandthat the system is not limited to only the components illustrated in theexemplary figures. Furthermore, one of ordinary skill in the art wouldunderstand that the location and arrangement of such components are notlimited solely to the location and arrangement illustrated in theexemplary figures.

While an ideal layout or arrangement of the system would have allcomponents shared between the light path traveling through the sampleand the light path traveling the reference, such an arrangement mightnot be physically possible or feasible. Examples of the disclosureinclude locating one or more components susceptible to drifting suchthat these components are common or shared among the two (or multiple)light paths, and locating components not susceptible to drifting (i.e.,stable components) to be non-common or not shared among the two (ormultiple light paths). For example, components susceptible to driftingcan include any electronics or optoelectronic components. Additionally,components not susceptible to drifting can include optics. Asillustrated in both system 600 of FIG. 6 and system 800 of FIG. 8 , thelight source (e.g., light source 602 and light source 802) and thedetector (e.g., detector 630 and detector 830) can be susceptible todrifting, and therefore can be shared between the two light paths (e.g.,light 656 and light 666; light 856 and light 866). On the other hand,choppers (e.g., chopper 634, chopper 636, chopper 834, and chopper 836)and optics (e.g., optics 616, optics 816, and optics 818) can be stableand not susceptible to drifting, and therefore can be individual to eachlight path.

FIG. 10A illustrates an exemplary plot of absorbance measurements usedfor determining the concentration and type a substance according toexamples of the disclosure. The absorbance measurement can comprise aplurality of frames 1076. Each frame 1076 can include one or morecalibration phases 1070 and one or more measurement phases 1072. Eachcalibration phase 1070 can include one or more steps to measure thenoise floor, stray light leakage, or both. For example, the light sourcein the system can be off or deactivated such that light is not incidenton the sample or reference. The detector can take a measurement todetermine the amount of dark current and stray light leakage. In someexamples, this measurement can be used to determine the zero level. Thedetector can send this measurement to the controller, and the controllercan store the measurement and/or the relevant information in memory. Thecontroller can use this information to determine the actual absorbanceof the substance in the sample or reference, or can use this informationto set the zero level.

Measurement phases 1072 can be interspersed in between the calibrationphases 1070. Measurement phases 1072 can include measuring theabsorbance spectrum of the sample during one time and then measuring theabsorbance spectrum of the reference during another time, as discussedabove. In some examples, any optical property (e.g., reflectivity,refractive index, density, concentration, scattering coefficient, andscattering anisotropy) can be measured instead of, or in addition to,the absorbance. The controller can divide (or subtract) the absorbancespectrum of the sample by the absorbance spectrum of thefilter/reference. In some examples, the controller can compare thereference absorbance to one or more absorbance values stored in a lookuptable or memory to determine the concentration of the substance in thesample. The measurement can be repeated multiple times within eachmeasurement phase 1072 to generate a plurality of sample points 1074,and the average of the sample points 1074 can be used. In some examples,the controller can compile sample points 1074 from multiple frames 1076when determining the average signal value. In some examples, theduration of at least one measurement phase 1072 can be based on apre-determined or fixed number of sample points 1074. In some examples,the number of sample points 1074 within at least one measurement phase1072 can be less than 10. In some examples, the number of sample points1074 within at least one measurement phase 1172 can be less than 100. Insome examples, the duration of at least one measurement phase 1072 canbe based on the stability (i.e., time before drifting by more than 10%)of the reference. For example, if the reference remains chemicallystable for 60 seconds, the duration of measurement phase 1072 can alsobe 60 seconds. In some examples, the duration of measurement phase 1072can be based on the stability of the shared components (e.g., lightsource and detector). Once a measurement phase 1072 is complete, thecontroller can proceed to the next frame 1076.

By calibrating more frequently, both the zero drift and the gain driftcan be accounted for. Additionally, unlike the procedure illustrated inFIG. 5 , the drift can be corrected at every frame, which can preventany significant deviation from the zero level. Furthermore, anyfluctuations and/or variations can be compensated for prior to, during,or shortly after the signal begins to deviate. By compensating for thefluctuations, drift, and/or variations and re-zeroing the zero levelearly on, instead of after tens or hundreds of sample points aremeasured, the average signal value can be more accurate. In someexamples, the number of sample points 1074 taken during measurementphase 1072 can be less than the number of sample points 574 taken duringmeasurement phase 572 (illustrated in FIG. 5 ). In some examples,measurement phase 1072 can be shorter than measurement phase 572.

In some examples, calibration phrase 1070 can include adjustment of theattenuation factor for those systems that employ a filter as a reference(e.g., filter 608 of system 600 illustrated in FIG. 6 ). FIG. 11illustrates an exemplary process flow during a calibration procedureaccording to examples of the disclosure. The light source can be turnedon or activated to emit light (step 1102 of process 1100). In a firsttime period, the choppers along both light paths (e.g., choppers 634 and636) can be off allowing unmodulated light (e.g., light 654 and light664) to transmit through to the sample (e.g., sample 620) and filter(e.g., filter 608) (step 1104 of process 1100). The detector can measureand generate a first set of electrical signals indicative of theunmodulated light transmitted through the sample and through thereference (step 1106 of process 1100). In a second time, the chopperslocated along both light paths can be turned on or activated such thatthe choppers are modulating light (step 1108 of process 1100). Thedetector can measure and generate a second set of electrical signalsindicative of the modulated light not absorbed by the sample and thereference (step 1110 of process 1100). If the absorbance from theunmodulated light is close to (e.g., within 10%) or the same asabsorbance from the modulated light (step 1112 of process 1100), thenthe system can increase or continue to increase the properties of light(e.g., light emitted from light source 602) (step 1114 of process 1100).In some examples, the increase can occur until the absorbance from thefirst set of electrical signals (i.e., unmodulated light) is no longerclose (e.g., within 10% from) to the absorbance from the second set ofelectrical signals (i.e., modulated light). If the limitations of thelight source are reached at any time during these steps (step 1116 ofprocess 1100), the attenuation factor can be adjusted instead ofadjusting the properties of the light source (step 1118 of process1100). Once the properties of light emitted from the light source, theattenuation factor or both are optimized, the calibration phase can becomplete (step 1120 of process 1100). Such a calibration procedure canbe used to prevent stray light from dominating over light transmittedthrough the sample. Furthermore, such a calibration procedure can leadto better drift stabilization because drift can be ascertained, andtherefore, compensated for.

In some examples, the overall time for measuring a certain number ofsample points 1074 can be greater than the overall time for measuringthe same number of sample points 574 (using the method illustrated inFIG. 6 ) due to interspersed calibration phases 1070. However, theprocedure illustrated in FIG. 5 can be limited to measurements where theSNR value is high, as discussed above. Although the overall time may belonger, the capability of measuring at low SNRs can outweigh thecompromise with longer overall time. In some examples, the system can beconfigured for utilizing the procedure illustrated in FIG. 5 when theSNR values are above a pre-determined threshold and utilizing theprocedure illustrated in FIG. 10 when the SNR values are below apre-determined threshold. In some examples, the pre-determine thresholdcan be on the order of 10⁻⁵. In some examples, the number of samplepoints 1074 needed for an accurate average signal value may be lower dueto the more frequent calibration phases preventing significantdeviations and drift.

FIG. 10B illustrates exemplary plots of absorbance measurements used fordetermining the concentration and type of substance according toexamples of the disclosure. The measurement can include a plurality ofmeasurement phases 1072 interspersed with calibration phases 1070. Thetop of FIG. 10B illustrates exemplary absorbance measurements for thesample, and the bottom of FIG. 10B illustrates exemplary absorbancemeasurements for the reference. For a given calibration phase 1070, thesignal can be sub-modulated, as illustrated in the figure. Similarly,for a given measurement phase 1072, the signal can, additionally oralternatively, be sub-modulated. By sub-modulating the signal, theabsorbance values can be measured sooner than without sub-modulation.Therefore, drift can be accounted and the measured values can be givento the controller earlier on (or within the measurement phase 1072),instead of having to wait for the completion of a measurement phase1072. In some examples, the method illustrated in FIG. 10B can be usedto add in modulation or change the frequency over time.

FIG. 10C illustrates an exemplary plot of an absorbance measurement usedfor determining the concentration and type of substance according toexamples of the disclosure. In some examples, the reference switchingcan be nested temporally. As illustrated in the figure, measurementphase 1072 can alternate with measurement phase 1073, where calibrationphase 1070 can be interspersed between the measurement phase 1072 andmeasurement phase 1073. Measurement phase 1072 can include measuring theabsorbance spectrum of the sample, and measurement phase 1073 caninclude measuring the absorbance spectrum of the reference. In someexamples, two-dimensional drift (e.g., gain and offset) can be correctedwhen the system is configured for operating at moderate frequencies, andone-dimensional drift (e.g., gain or offset) can be corrected when thesystem is configured for operating at high frequencies.

Due to the inhomogeneous nature of the concentration of substanceswithin a sample, certain applications may require measurements alongseveral different areas and each area can have a different location andpath length relative to the optical components in the system. Therefore,a system that can measure several different areas and can recognize theactual or relative differences in path lengths from the opticalcomponents to the sample may be desired.

FIG. 12 illustrates an exemplary block diagram of an exemplary systemcapable of measuring several different locations within a sample andcapable of recognizing different path lengths, angles of incidence, orboth associated with the different locations according to examples ofthe disclosure. System 1200 can include interface 1280, optics 1290,light source 1202, detector 1230, and controller 1240. Interface 1280can include input regions 1282, interface reflected light 1284,reference 1208, and output regions 1256. Optics 1290 can includeabsorber or light blocker 1292, microoptics 1294, and light collectionoptics 1216. Sample 1220 can be located near, close to, or touching aportion of system 1200. Light source 1202 can be coupled to controller1240. Controller 1240 can send a signal (e.g., current or voltagewaveform) to control light source 1202 to emit light towards thesample-system interface. Depending on whether the system is measuringthe substance in the sample or in the reference, light source 1202 canemit light towards input regions 1282 or reference 1208.

Input regions 1282 can be configured to allow light to exit system 1200and be incident on sample 1220. Light can penetrate a certain depth intosample 1220 and can reflect back towards system 1200. The reflectedlight can enter back into system 1200 through output regions 1256 andcan be collected by light collection optics 1216, which can redirect,collimate, and/or magnify the reflected light. The reflected light canbe directed towards detector 1230, and detector 1230 can measure lightthat has penetrated into sample 1220 and reflected back into system1230. Detector 1230 can be coupled to controller 1240 and can send anelectrical signal indicative of the reflected light to controller 1240.

Light source 1202 can, additionally or alternatively, emit light towardsreference 1208. Reference 1208 can reflect light towards microoptics1294. Microoptics 1294 can redirect, collimate, and/or magnify thereflected light towards detector 1230. Detector 1230 can measure lightreflected from reference 1208 and can generate an electrical signalindicative of this reflected light. Controller 1240 can be configured toreceive both the electrical signal indicative of the reflected light andthe electrical signal indicative of light reflected from reference 1208from detector 1230.

In both situations where the system is measuring the substance in thesample and in the reference, light emitted from light source 1202 canreflect off the sample-system interface. Light reflected off thesample-system interface can be referred to as interface reflected light1284. In some examples, interface reflected light 1284 can be lightemitted from light source 1202 that has not reflected off sample 1220 orreference 1208 and can be due to light scattering. Since interfacereflected light 1284 can be unwanted, absorber or light blocker 1292 canprevent interface reflected light 1284 from being collected bymicrooptics 1294 and light collection optics 1216, which can preventinterface reflected light 1284 from being measured by detector 1230.

FIG. 13 illustrates a cross-sectional view of an exemplary systemcapable of measuring the concentration and type of one or moresubstances at different locations in a sample and capable of resolvingthe properties of the optical paths associated with the differentlocations in the sample according to examples of the disclosure. In someexamples, the one or more substances of interest can have a lowconcentration (e.g., more than one order of magnitude less) in thesample than other substances of interest. In some examples, theconcentration of the one or more substances can lead to a low SNR (i.e.,SNR<10⁴ or 10⁻⁵). System 1300 can be close to, touching, resting on, orattached to sample 1320. Sample 1320 can include one or more locations,such as location 1357 and location 1359, where the substance of interestcan be measured.

System 1300 can include light source 1302. Light source 1302 can beconfigured to emit light 1350. Light source 1302 can be any sourcecapable of generating light including, but not limited to, a lamp,laser, LED, OLED, EL source, super-luminescent diode, super-continuumsource, fiber-based source, or a combination of one or more of thesesources. In some examples, light source 1302 can be capable of emittinga single wavelength of light. In some examples, light source 1302 can becapable of emitting a plurality of wavelengths of light. In someexamples, light source 1302 can be any tunable source capable ofgenerating a SWIR signature. System 1300 can include input region 1382located close to or near sample 1320 or an edge of the system. Inputregion 1382 can be formed by one or more transparent componentsincluding, but not limited to, a window, optical shutter, and mechanicalshutter.

Light 1350 can exit system 1300 through input region 1382. Lightdirected at location 1357 in sample 1320 can be referred to as light1352. Light 1352 can penetrate through sample 320 and can be incident onlocation 1357. In some examples, the angle of incidence of light 1352 atlocation 1357 can be 45°. In some examples, light 1352 can be acollimated beam. Location 1357 can include a concentration of thesubstance of interest. Light 1352 can be partially absorbed at location1357 and can be partially reflected as light 1354. In some examples,light 1354 can be formed by light transmitting through sample 1320.Light 1354 can penetrate through sample 1320 and can enter system 1300at location 1313 of lens 1310. In some examples, lens 1310 can be incontact or near sample 1320. In some examples, lens 1310 can be any typeof optical component capable of changing the behavior and properties ofthe incoming light. Lens 1310 can include a plurality of locations, suchas location 1313 and location 1317, where light can to enter system1300. In some examples, lens 1310 can include a transparent material. Insome examples, lens 1310 can be a Fresnel lens or a lens configured witha large aperture (e.g., an aperture larger than the size of the incominglight beam) and a short focal length. In some examples, lens 1310 can bea Silicon lens.

System 1300 can include optics to magnify or project the incoming lightbeam. In some examples, optics can be a system capable of reimaging orprojecting the image of the incoming light at the sample-systeminterface to another location. For example, the system can reimage theangles of incident light and the position of incident light to anotherplane (e.g., a plane located closer to the detector array 1330). System1300 can include lens 1316 and lens 1318 configured for reimagininglight 1364. Lens 1316 and lens 1318 can be configured to produceintermediate planes of focus. With intermediate planes of focus, thelength of the focus can be extended. For example, to reimage the opticalpaths at the sample-system interface onto detector array 1330 withoutmagnification, location 1357 can be located a distance f away from lens1310. The distance f can be equal to the focal length of lens 1310. Lens1316 can be located a distance 2f (i.e., two times the focal length)away from lens 1310, lens 1318 can be located a distance 2f from lens1316, microlens array 1329 can be located a distance 2f away from lens1318, and detector array 1330 can be located a distance f away frommicrolens array 1329. In some examples, the optics in system 1300 canmagnify the image by a factor, such as 2.5× or 5×.

Light 1354 can transmit through lens 1316 and 1318 and can be incidenton microlens 1323, included in microlens array 1329. Microlens array1329 can comprise a plurality of microlenses, such as microlens 1321,microlens 1323, microlens 1325, and microlens 1327 attached to asubstrate. In some examples, microlens 1321, microlens 1323, microlens1325, and microlens 1327 can be any type of lens and can include anytype of material conventionally used in lenses. A microlens can be asmall lens or one that is smaller (e.g., a lens with a diameter lessthan 1 mm) than a conventional lens. In some examples, two or more ofmicrolenses included in the microlens array 1329 can have the sameoptical and/or physical properties. One skilled in the art wouldappreciate that the same optical properties and the same physicalproperties can include tolerances that result in a 15% deviation. Light1354 can transmit through microlens 1323 and can be incident on detectorpixel 1333. In some examples, microlens array 1329 can be coupled to oneor more apertures or apertures. In some examples, microlens array 1329can be coupled to a patterned aperture, such as an aperture wherelocations between adjacent microlenses are opaque to prevent lightmixing.

Detector pixel 1333 can be included in detector array 1330. Detectorarray 1330 can include a plurality of detector pixels, such as detectorpixel 1331, detector pixel 1333, detector pixel 1335, and detector pixel1337. In some examples, detector array 1330 can be a detector includinga single detector pixel detector. In some examples, at least onedetector pixel can be independently controlled from other detectorpixels included in the detector array 1330. In some examples, at leastone detector pixel can be capable of detecting light in the SWIR. Insome examples, at least one detector pixel can be a SWIR detectorcapable of operating between 2.2-2.7 μm. In some examples, at least onedetector pixel can be a HgCdTe, InSb, or InGaAs based detector. In someexamples, at least one detector pixel can be capable of detecting aposition and/or angle of the incoming light beam. Detector pixel 1333can detect light 1354 and can generate an electrical signal indicativeof the properties of light 1354. Detector array 1430 can transmit theelectrical signal to controller 1340. Controller 1340 can process and/orstore the electrical signal.

System 1300 can include reflector 1322. Light source 1302 can emit light1364. Light 1364 can be directed at reflector 1322. Reflector 1322 caninclude any type of material capable of at least partially reflectinglight. Exemplary reflective materials can include, but are not limitedto, Titanium (Ti), Cobalt (Co), Niobium (Nb), Tungsten (W), NickelChrome (NiCr), Titanium Tungsten (TiW), Chrome (Cr), Aluminum (Al), Gold(Au), and Silver (Ag). The thickness of reflector 1322 can be determinedbased on the wavelength of light, type of material, and/or composition.In some examples, the size and shape of reflector 1322 can be configuredto be larger or the same as the size and/or shape of the light beamincluded in light 1364. One skilled in the art would appreciate that thesame size and the same shape can include tolerances that result in a 15%deviation. In some examples, reflector 1322 can be configured such thatthe reflectivity of light 1364 can be greater than 75%. In someexamples, reflector 1322 can be configured such that the reflectivity oflight 1364 can be greater than 90%. In some examples, the size and shapeof reflector 1322 can be such that no or minimal (e.g., less than 10%)amounts of light 1364 is allowed to transmit through reflector 1322 andlight 1364 is prevented from penetrating through sample 1320. In someexamples, reflector 1322 can be configured to reflect light 1364 as aspecular reflection. In some examples, reflector 1322 can be aspectroscopically neutral blocker. In some examples, the reference canbe formed by chopping light 1364 between sample 1320 and reference(e.g., reflector 1322).

Light 1364 can reflect off reflector 1322 towards lens 1316. Similar tolens 1312 and lens 1314, lens 1316 and lens 1318 can reimage or projectthe image of the incoming light at the sample-system interface. In someexamples, lens 1316 and lens 1318 can be configured such that a replicaof the optical paths are the sample-system interface is produced ontoanother plane (e.g., plane where the detector array 1330 is located)without magnification. In some examples, lens 1316 and lens 1318 can beconfigured such that a magnification, such as 2.5×-5× magnification, isintroduced into the replica. Light 1364 can transmit through lens 1316towards lens 1318. Light 1364 can transmit through lens 1318 and can beincident on lens 1319.

Lens 1319 can be any type of lens configured for spreading out theincoming light beam. In some examples, lens 1319 can be a negative lens,which can be a lens with a focal length that is negative. In someexamples, lens 1319 can be a prism. In some examples, lens 1319 caninclude a different prism wedge angled for each detector pixel in thedetector array 1330. In some examples, system 1300 can be configuredwith a beamsplitter for spreading out the incoming light. Lens 1319 canbe configured to spread out or divide light into multiple beams, such aslight 1366 and light 1367. In some examples, lens 1319 can spread outlight such that each light beam is directed to a different detectorpixel on the detector array 1330. In some examples, lens 1319 canuniformly spread out light such that the optical properties of eachlight beam are the same. One skilled in the art would appreciate thatthe same optical properties can include tolerances that result in a 15%deviation. In some examples, lens 1319 can spread out the light beamsuch that intensities of at least two light beams are different. In someexamples, lens 1319 can comprise multiple lenses or microlenses. In someexamples, the size and/or size of lens 1319 can be based on the numberof detector pixels and/or the intensity of the one or more light beamsexiting lens 1319. In some examples, one or more apertures can becoupled to lens 1319 to control the intensity and/or direction of lightexiting lens 1319. In some examples, lens 1319 or system 1300 can beconfigured such that light that reflects off a surface of sample 1320 oran edge of system 1300 reflects back into the system (i.e., light thathas not traveled through sample 1320) and is prevented from beingincident on lens 1319, although stray light or background light can beincident on lens 1319.

Light 1364 can transmit through lens 1319 to form light 1366. Light 1366can be incident on detector pixel 1333. Detector pixel 1333 can detectlight 1366 and can generate an electrical signal indicative of theproperties of light 1366. The electrical signal can be transmitted fromdetector array 1330 to controller 1340. Controller 1340 can processand/or store the electrical signal. Controller 1340 can utilize thesignal information measured from light 1354 to determine thereflectivity or concentration of the substance located at location 1357within sample 1320 and can utilize the signal information from light1366 to determine the properties of reflector 1322. Using any of theabove discussed methods, controller 1340 can process both signalinformation to determine the concentration and type of substance atlocation 1357 located in sample 1320.

There can be an inhomogeneous distribution of the one or more substancesin the sample, which can produce variations in the optical properties(e.g., linear birefringence, optical activity, diattenuation) of thesample. Therefore, a system capable of measuring multiple locationswithin sample 1320 and corresponding measurements can be beneficial. Tomeasure a different location, such as location 1359 different fromlocation 1357, light source 1302 can emit light 1350 towards inputregion 1382. In some examples, system 1300 can include multipleapertures. For example, system 1300 can include at least two apertures,where light 1352 can exit one aperture and light 1353 can exit the otheraperture. Light directed at location 1359 can be referred to as light1353. Light 1353 can penetrate through sample 1320 and can be incidenton location 1359. Light 1353 can have any angle of incidence at location1359 including, but not limited to, 45°. In some examples, light 1353can be a collimated beam. Location 1359 can include a concentration ofone or more substances of interest. Light 1353 can be partially absorbedat location 1359 and can be partially reflected as light 1355. In someexamples, light 1355 can be formed by light transmitting through sample1320. Light 1355 can travel through sample 1320 and can enter system1300 at location 1317 of lens 1310. Light 1355 can transmit through lens1310 and can be directed towards lens 1312. Light 1355 can transmitthrough lens 1312 and lens 1314 and can be directed towards microlens1327 of microlens array 1329. As illustrated in the figure, althoughlens 1312 and lens 1314 can be shared by light 1354 and light 1355(i.e., different light beams), the locations where light 1354 and light1355 are incident on lens 1312 and lens 1314 can be different.Additionally or alternatively, light 1354 and light 1355 can share lens1312 and lens 1314 by utilizing the lenses at different times.

Light 1355 can be incident on microlens 1327, can transmit throughmicrolens 1327, and can be incident on detector pixel 1337 of detectorarray 1330. Detector pixel 1337 can detect light 1355 and can generatean electrical signal indicative of the properties of light 1355.Detector array 1330 can transmit the electrical signal to controller1340. Controller 1340 can process and/or store the electrical signal.

Similar to the discussion given above, a reference signal can bemeasured using reflector 1322. Light source 1302 can emit light 1364towards reflector 1322. Reflector 1322 can be configured to reflectlight 1364 towards detector array 1330. Light 1364 can transmit throughlens 1316 and lens 1318. Light 1364 can be incident on lens 1319, whichcan be configured to spread out the incoming light beam. Lens 1319 canform light 1367, which can be incident on detector pixel 1337. Detectorpixel 1337 can detect light 1367 and can generate an electrical signalindicative of the properties of light 1367. The electrical signal can betransmitted from detector array 1330 to controller 1340. Controller 1340can process and/or store the electrical signal. Controller 1340 canutilize the signal information measured from light 1355 to determine thereflectivity or concentration of the substance at location 1359 and canutilize the signal information from light 1367 to determine theproperties of the reflector 1322. Controller 1340 can process bothsignal information to determine the concentration of the substance atlocation 1359. In some examples, controller 1340 can determine theproperties of reflector 1322 or light 1366 incident on detector pixel1333 and light 1367 incident on detector pixel 1337 simultaneouslywithout the need for separate measurements. In some examples, location1357 and location 1359 can have the same depth from the surface ofsample 1320. One skilled in the art would appreciate that the same depthcan include tolerances that result in a 15% deviation. In some examples,location 1357 and location 1359 can have different depths from thesurface of sample 1320. Controller 1340 can measure the reflectivity,refractive index, density, concentration, scattering coefficient,scattering anisotropy, absorbance, or any combination of opticalproperties at both location 1357 and location 1359 and can average themeasured values. Although the figure and discussion above relates to twolocations in the sample, examples of the disclosure can include anynumber of locations and are not limited to one or two locations.

Although detector array 1330 can be configured to detect the angle orlocation of incident light, controller 1340 can determine thisinformation based on the detector pixel included in the detector array1330. In some examples, light emitted from light source 1302 can be awell-defined (i.e., directional and sharp) light beam and reflectedlight from sample 1320 can be specular, one or more microlens includedin microlens array 1329 can correspond to a different location in sample1320. Additionally, one or more detector pixels included in detectorarray 1330 can be associated with a microlens in the microlens array1329. For example, when controller 1340 or detector array 1330 measureslight incident on detector pixel 1337, system 1300 can determine thatthe incident light originated from location 1359 in sample 1320 due tothe association of detector pixel 1337 to location 1359. Additionally,when controller 1340 or detector array 1330 measures light incident ondetector pixel 1333, system 1300 can determine that the incident lightoriginated from location 1357 due to the association of detector pixel1333 to location 1357. In some examples, detector pixel 1331 anddetector pixel 1435 can be associated to additional locations (notshown) in sample 1320.

As discussed above, due to the fluctuations, drift, and/or variationsthat can be introduced into the electrical signal received by thecontroller, it may be advantageous to share components among one or morelight paths that travel through the sample and the light path thatreflects off the reflector. FIG. 14A illustrates a cross-sectional viewof an exemplary system configured to measure a concentration and type ofone or more substances located in a sample using shared optics accordingto examples of the disclosure. In some examples, the one or moresubstances of interest can have a low concentration (e.g., more than oneorder of magnitude less) in the sample than other substances ofinterest. In some examples, the concentration of the one or moresubstances can lead to a low SNR (e.g., SNR<10⁻⁴ or 10⁻⁵). System 1400can be close to, touching, resting on, or attached to sample 1420.Sample 1420 can include one or more locations, such as location 1457 andlocation 1459, where the substance can be measured.

System 1400 can include light source 1402. Light source 1402 can beconfigured to emit light 1450. Light source 1402 can be any sourcecapable of generating light including, but not limited to, a lamp,laser, LED, OLED, EL source, super-luminescent diode, super-continuumsource, fiber-based source, or a combination of one or more of thesesources. In some examples, light source 1402 can be capable of emittinga single wavelength of light. In some examples, light source 1402 can becapable of emitting a plurality of wavelengths of light. In someexamples, light source 1402 can be any tunable source capable ofgenerating a SWIR signature. System 1400 can include input region 1482located close to or near sample 1420 or an edge of the system. Inputregion 1482 can be formed by one or more transparent componentsincluding, but not limited to, a window, optical shutter, or mechanicalshutter.

Light 1450 can exit system 1400 through input region 1482. Light thatexits system 1400 and travels through sample 1420 to location 1457 canbe referred to as light 1452. Light 1452 can have any angle of incidenceat location 1457 including, but not limited to, 45°. In some examples,light 1450 can be a collimated beam. Location 1457 can include aconcentration of the substance of interest. Light 1452 can be partiallyabsorbed at location 1457 and can be partially reflected as light 1454.In some examples, light 1454 can be formed by light transmitting throughthe sample. Light 1454 can penetrate through sample 1420 and can entersystem 1400 at location 1413 of optics 1410. In some examples, optics1410 can be in contact or near a surface of sample 1420. In someexamples, optics 1410 can be any type of optical component capable ofchanging the behavior and properties of the incoming light. Optics 1410can include a plurality of locations, such as location 1413 and location1417, where light can enter. In some examples, optics 1410 can include atransparent material. In some examples, optics 1410 can be a Fresnellens or a lens configured with a large aperture (e.g., an aperturelarger than the size of the incoming light beam) and a short focallength. In some examples, optics 1410 can be a Silicon lens.

System 1400 can include optics to magnify or project the incoming lightbeam. Similar to the optics illustrated in and discussed with respect tosystem 1300 illustrated in FIG. 13 , the optics in system 1400 can becapable of reimagining the optical paths, including the path lengths,angles of incidence, and exit locations, at the edge of system 1400 toanother plane closer to detector array 1430. To reduce the differencesin any fluctuations, drifts, and/or variations between a light path(e.g., light 1452 or light 1453) penetrating through the sample 1420 anda light path reflecting off a reference (e.g., reflector 1422), system1400 can share the optics between the two different light paths. System1400 can include optics 1416 and optics 1418 for reimaging both lightthat has traveled through sample 1320 and light used as a referencesignal. In some examples, optics 1416 and optics 1418 can be configuredsuch that a replica of the image located at the edge of the system canbe produced onto another plane (e.g., the plane where the detector array1430 is located) without magnification. In some examples, optics 1416and optics 1418 can be configured to introduce a magnification, such asa 2.5×-5× magnification, into the replica.

FIG. 14B illustrates the system including optics that are shared forboth the incident and return or reflected light. Optics 1416 can beshared by light 1450 and light 1464 emitted from light source 1402,light 1454 and light 1455 that has traveled through sample 1420, andlight 1564 that has reflected off reflector 1422. In some examples, atleast two of the angles of incidence of light 1454, light 1455, light1464, and light 1450 at optics 1416 and/or optics 1418 can be different.

Referring to FIGS. 14A-14B, light 1454 can transmit through optics 1416and optics 1418 and can be incident on microoptics 1423, included inmicrooptics unit 1429. Microoptics unit 1429 can comprise a plurality ofmicrolenses, such as microoptics 1423 and microoptics 1427, attached toa substrate. A microlens can be a small lens or one that is smaller(e.g., a lens with a diameter less than 1 mm) than a conventional lens.In some examples, the microlenses can be any type of lens and caninclude any type of material conventionally used in lenses. In someexamples, two or more of the microlenses can have the same opticaland/or physical properties. One skilled in the art would appreciate thatthe same optical properties and the same physical properties can includetolerances that result in a 15% deviation. Light 1454 can transmitthrough microoptics 1423 and can be incident on detector pixel 1433. Insome examples, microoptics unit 1429 can be coupled to one or moreapertures or apertures. In some examples, microoptics unit 1429 can becoupled to a patterned aperture, such as an aperture where locationsbetween adjacent microoptics are opaque to prevent light mixing.

Detector pixel 1433 can be included in detector array 1430. Detectorarray 1430 can include a plurality of detector pixels, such as detectorpixel 1433 and detector pixel 1437. In some examples, detector array1430 can be a single detector pixel detector. In some examples, at leastone detector pixel can be independently controlled from other detectorpixels included in detector array 1430. In some examples, at least onedetector pixel can be capable of detecting light in the SWIR. In someexamples, at least one detector pixel can be a SWIR detector capable ofoperating between 2.2-2.7 μm. In some examples, at least one detectorpixel can be a HgCdTe, InSb, or InGaAs based detector. In some examples,at least one detector pixel can be capable of detecting a path length,angle of incidence, and/or exit location of the incoming light beam.Detector pixel 1433 can detect light 1454 and can generate an electricalsignal indicative of the properties of light 1454. Detector array 1430can transmit the electrical signal to controller 1440. Controller 1440can process and/or store the electrical signal.

System 1400 can determine the concentration of the substance in sample1420 by utilizing the information from light penetrating through thesample in conjunction with the information from light reflecting offreflector 1422. Light source 1402 can emit light 1464, which can bedirected at reflector 1422. Reflector 1422 can include any type ofmaterial capable of at least partially reflecting light. Exemplaryreflective materials can include, but are not limited to, Ti, Co, Nb, W,NiCr, TiW, Cr, Al, Au, and Ag. The thickness of the reflector 1422 canbe configured based on the wavelength of light, type of material, and/orcomposition. In some examples, the size and shape of reflector 1422 canbe configured to be larger or the same as the size and/or shape of thelight beam included in light 1464. One skilled in the art wouldappreciate that the same optical properties and the same physicalproperties can include tolerances that result in a 15% deviation. Insome examples, the reflector 1422 can be configured to reflect greaterthan 75% of light 1464. In some examples, reflector 1422 can beconfigured to reflect greater than 90% of light 1464. In some examples,the size and shape of reflector 1422 can be such that no or a minimal(e.g., less than 10%) amount of light 1464 is allowed to transmitthrough reflector 1422, and light 1464 is prevented from travelingthrough sample 1420. In some examples, reflector 1422 can be configuredto reflect light 1464 as a specular reflection. In some examples,reflector 1422 can be a spectroscopically neutral blocker. In someexamples, the reference can be formed by chopping light 1464 between thesample 1420 and reference (e.g., reflector 1422).

Light 1464 can reflect off reflector 1422 towards optics 1416. Light1464 can transmit through optics 1416 towards optics 1418. Light 1464can transmit through optics 1418 and can be incident on optics 1419.Optics 1419 can be any type of lens configured for spreading out theincoming light beam. In some examples, optics 1419 can be a negativelens, which can be a lens with a focal length that is negative. In someexamples, optics 1419 can be a prism. In some examples, optics 1419 caninclude a different prism wedge angled for each detector pixel indetector array 1430. In some examples, system 1400 can be configuredwith a beamsplitter for spreading out the incoming light beam. In someexamples, optics 1419 can be configured to spread out or divide lightinto multiple beams, such as light 1466 and light 1467. In someexamples, optics 1419 can spread out light such that each light beam canbe directed to a different detector pixel. In some examples, optics 1419can uniformly spread out light such that the optical properties of eachlight beam can be the same. One skilled in the art would appreciate thatthe same optical properties can include tolerances that result in a 15%deviation. In some examples, optics 1419 can spread out light beam suchthat intensities of at least two light beams are different. In someexamples, optics 1419 can comprise multiple optics or microoptics. Insome examples, the size and/or size of optics 1419 can be based on thenumber of detector pixels and/or the properties of the one or more lightbeams exiting optics 1419. In some examples, an aperture can be coupledto optics 1419 to control the properties and/or direction of lightexiting optics 1419. In some examples, optics 1419 or system 1400 can beconfigured such that light that reflects off a surface of sample 1420 oran edge of system 1400 reflects back into the system (i.e., light thathas not traveled through sample 1420) and is prevented from beingincident on optics 1419, although stray light or background light can beincident on optics 1419.

Light 1464 can transmit through optics 1419 to form light 1466. Light1466 can be incident on detector pixel 1433. Detector pixel 1433 candetect light 1466 and can generate an electrical signal indicative ofthe properties of light 1466. Detector array 1430 can transmit theelectrical signal to controller 1440. Controller 1440 can process and/orstore the electrical signal. Controller 1440 can utilize the signalinformation measured from light 1454 to determine the reflectivity orconcentration of the substance at location 1457 and can utilize thesignal information from light 1466 to determine the properties ofreflector 1422. Using any of the above discussed methods, controller1440 can process both signal information to determine the concentrationof the substance at location 1457 located in sample 1420.

Similar to measuring the concentration of the substance at location1557, the same components can be used to measure the concentration ofthe substance at location 1559. Light source 1502 can emit light 1550,which can exit system 1500 at input region 1582 to form light 1553. Insome examples, system 1500 can include multiple apertures. For example,system 1500 can include at least two apertures, where light 1552 canexit one aperture and light 1553 can exit another aperture. Light 1553can be incident on location 1559 and can reflect back into system 1500as light 1555. Light 1555 can enter system 1500 through optics 1510 atlocation 1517. Light 1555 can transmit through optics 1516 and optics1518 and can be incident on microoptics 1527. Light 1555 can transmitthrough microoptics 1527 and can be detected by detector pixel 1537included in detector array 1530. Detector pixel 1537 can detect light1555 and can generate an electrical signal indicative of the propertiesof the detected light 1555. The electrical signal can be transmittedfrom the detector array 1530 to controller 1540. Controller 1540 canprocess and/or store the electrical signal. Controller 1440 can utilizethe signal information measured from light 1455 to determine thereflectivity or concentration of the substance at location 1459 and canutilize the signal information from light 1467 to determine theproperties of the reflector 1422. Controller 1440 can process bothsignal information to determine the concentration and type of substanceat location 1459. In some examples, controller 1440 can determine theproperties of reflector 1422 (or light 1466 incident on detector pixel1433) and light 1467 incident on detector pixel 1437 simultaneouslywithout the need for separate measurements. In some examples, location1457 and location 1459 can have the same depth from the surface ofsample 1420. One skilled in the art would appreciate that the same depthcan include tolerances that result in a 15% deviation. In some examples,location 1457 and location 1459 can have different depths from thesurface of sample 1420. Controller 1440 can measure the reflectivity,refractive index, density, concentration, scattering coefficient,scattering anisotropy, absorbance, or a combination of the opticalproperties at both location 1457 and location 1459 and can average themeasured values. Although the figure and discussion above relates to twolocations in the sample, examples of the disclosure can include anynumber of locations and are not limited to one or two locations.

As illustrated in the figure, system 1400 can include a plurality ofmicrooptics and a plurality of detector pixels, where each microopticscan be coupled to a detector pixel. Each microoptics-detector pixel paircan be associated with a location in the sample. In some examples, theassociation can be one microoptics-detector pixel pair to one locationin the sample. For example, microoptics 1423 and detector pixel 1433 canbe associated with location 1457 and microoptics 1427, and detectorpixel 1437 can be associated with location 1459. Since controller 1440can associate detector pixel 1433 and detector pixel 1437 to differentlocation (e.g., location 1457 and location 1459), controller 1450 candetermine and locate different concentrations of the substance fordifferent areas of sample 1420.

While system 1300 (illustrated in FIG. 13 ) and system 1400 (illustratedin FIG. 14 ) can account for fluctuations, drift, and/or variations dueto shared components (e.g., light source, lenses, and/or detectorarray), these systems may not account for light that reflects and/orscatters at the edge of the system. FIG. 15 illustrates across-sectional view of an exemplary system configured to measure aconcentration and type of one or more substances in a sample andconfigured to reduce or eliminate light reflections or scattering at theedge of the system according to examples of the disclosure. Similar tosystem 1300 and system 1400, system 1500 can comprise multiplecomponents including a light source 1502, optics 1510, optics 1516,optics 1518, microoptics unit 1527, detector array 1530, and controller1540. These components can include one or more properties discussedabove with reference to the components included in system 600, system800, system 1300, and system 1400.

The concentration of the substance at location 1557 can be measuredusing light 1550 exiting system 1500 through input region 1582, light1552, and light 1554 formed by reflecting off location 1557. Light 1554can enter system 1500 at location 1513 and can transmit through optics1510, optics 1516, optics 1518, and microoptics 1523, included inmicrooptics unit 1529. Detector pixel 1533, included in detector array1530, can detect light 1554 and can generate an electrical signalindicative of the optical properties of light 1554. The concentration ofthe substance at location 1559 can be measured using light 1550 exitingsystem 1500 through input region 1582, light 1553, and light 1555 formedby reflecting off location 1559. Light 1555 can enter system 1500 atlocation 1517 and can transmit through optics 1510, optics 1516, optics1518, and microoptics 1527, included in microoptics unit 1529. Detectorpixel 1537, included in detector array 1530, can detect light 1555 andcan generate an electrical signal indicative of the optical propertiesof light 1555. The optical properties of the reference or reflector 1522can be determined using light 1564 that reflects off reflector 1522,transmits through optics 1516, optics 1518, and optics 1519. Light 1564can be spread out by optics 1519 to form light 1566 incident on detectorpixel 1533 and light 1567 incident on detector pixel 1537. Controller1540 can receive electrical signals indicative of light reflected offlocation 1557, location 1559, and reflector 1522 to determine theconcentration of the substance at one or more locations in sample 1520.

Although light 1550 can be directed towards input region 1582 and can beconfigured for exiting system 1500, in some examples, light 1550 canscatter or reflect off the edge of system 1500 at one or more locations(e.g., location between input region 1582 and reflect 1522. Light thatscatters or reflects off the edge of the system and back into the system1500 can be referred to as light 1584. Since light 1584 can includestray light that reflects back into system 1500, a portion or all oflight 1584 can be incident on one or more microoptics (e.g., microoptics1523 or microoptics 1527). Light that is incident on the microoptics cantransmit to one or more detector pixels (e.g., detector pixel 1633 ordetector pixel 1637) included in the detector array 1530. As a result,stray light can be measured by detector array 1530, which canerroneously change the electrical signal that the detector array 1530can generate and transmit to controller 1540. Any change in electricalsignal due to stray light can lead to a false measurement ordetermination of the concentration of the substance in the sample 1520.

Therefore, to prevent light 1584 from being detected by detector array1530, system 1500 can direct light 1584 towards optics 1516 and optics1518. Light 1584 can transmit through optics 1516 and optics 1518 andcan be incident on light blocker 1592. Light blocker 1592 can includeany material capable of absorbing or blocking light. In some examples,light blocker 1592 can include any material (e.g., an anti-reflectioncoating) that prevents incident light from reflecting. In some examples,light blocker 1592 can include any material that reflects at wavelengthsdifferent from the detection wavelengths of detector array 1530. In someexamples, system 1500 can, additionally or alternatively, include ananti-reflection coating at one or more locations along the edge of thesystem.

Examples of the disclosure can include other types of optics or opticsystems and are not limited to the systems illustrated in FIGS. 13,14A-14B, and 15 . Additionally, examples of the disclosure can includemeasuring the concentration of a sample at different depths within thesample, which can lead to optical paths with different path lengths.FIG. 16A illustrates a cross-sectional view of an exemplary systemconfigured to measure a concentration and type of one or more substanceslocated at different depths in a sample according to examples of thedisclosure. In some examples, the one or more substances of interest canhave a low concentration (e.g., more than one order of magnitude less)in the sample than other substances of interest. In some examples, theconcentration of the one or more substances can lead to a low SNR (i.e.,SNR<10⁻⁴ or 10⁻⁵). System 1600 can be close to, touching, resting on, orattached to sample 1620. Sample 1620 can include one or more locations,such as location 1657 and location 1659, where the substance can bemeasured. Location 1657 can be located a depth 1661 away from the edgeof the system, and location 1659 can be located a depth 1663 away fromthe edge of the system. In some examples, depth 1661 can be differentfrom depth 1663.

System 1600 can include light source 1602. Light source 1602 can beconfigured to emit light 1650. Light source 1602 can be any sourcecapable of generating light including, but not limited to, a lamp,laser, LED, OLED, EL source, super-luminescent diode, super-continuumsource, fiber-based source, or a combination of one or more of thesesources. In some examples, light source 1602 can be capable of emittinga single wavelength of light. In some examples, light source 1602 can becapable of emitting a plurality of wavelengths of light. In someexamples, light source 1602 can be any tunable source capable ofgenerating a SWIR signature. System 1600 can include input region 1682located close to or near sample 1620 or an edge of the system. Inputregion 1682 can be formed by one or more transparent componentsincluding, but not limited to, a window, optical shutter, or mechanicalshutter.

Light 1650 can exit system 1600 through input region 1682. Light thatexits system 1600 and travels to location 1657 can be referred to aslight 1652. Light 1652 can have any angle of incidence at location 1657including, but not limited to, 45°. In some examples, light 1650 can acollimated beam. Location 1657 can include a concentration of thesubstance of interest. Light 1652 can be partially absorbed at location1657 and can be partially reflected as light 1654. In some examples,light 1654 can be formed by light transmitting through the sample. Light1654 can penetrate through sample 1620 and can enter system 1600 atlocation 1613 of optics 1610. In some examples, optics 1610 can be incontact or near sample 1620. Optics 1610 can be any type of opticalcomponent capable of changing the behavior and properties of theincoming light. Optics 1610 can include a plurality of locations,including location 1613 and 1617, where light is allowed to enter. Insome examples, optics 1610 can include a transparent material. In someexamples, optics 1610 can be a Fresnel lens or a lens configured with alarge aperture (e.g., an aperture larger than the size of the incominglight beam) and a short focal length. In some examples, optics 1610 canbe a Silicon lens.

System 1600 can include optics, such as a confocal system. A confocalsystem can be any type of optical system configured for resolving pathlengths, angles of incidence, exit locations, or any combination ofthese properties of multiple optical paths within a sample. In someexamples, the optical system configured for accepting one or moreincident light rays with a path length within a range of path lengthsand an angle of incidence within a range of angles, and rejectingoptical paths with a path length outside the range of path lengths andwith an angle of incidence outside the range of angles. A confocalsystem can include optics 1616 and optics 1618. Optics 1616 and optics1618 can be objective lenses. An objective lens can be a lens capable ofcollecting the incident light and magnifying the light beam, whilehaving a short focal length. Optics 1616 can collect light 1654 anddirect light 1654 towards an aperture included in aperture 1686.Aperture 1686 can include one or more apertures, such as opening 1685,configured to allow light to transmit through. Aperture 1686 can becapable of selecting light with one or more specific path lengths,angles of incidence, or both and rejecting or attenuating light withother path lengths or angles of incidence. Selection and rejection oflight based on path length, angle of incidence, or both can be optimizedby adjusting the aperture size (i.e., the size of the aperture in theaperture plane). The selected light (i.e., light with one or morespecific path lengths, angles of incidence, or both) can be in focuswhen it reaches an aperture in the aperture plane, and rejected lightcan be out of focus. Light that is out of focus can have a beam sizethat is larger than the aperture size, can have an angle of incidencethat is outside the collection range, or both, and therefore can berejected. Light that is in focus can have a light beam that is within arange of path lengths and range of collection angles, and therefore canbe allowed to transmit through the aperture plane. In some examples, thesystem can include one or more modulating elements, such asmicromirrors, acousto-optic modulators, or electro-optic modulators.

Light 1654 exiting opening 1685 can transmit through optics 1618 and canbe incident on microoptics 1623, included in microoptics unit 1629.Microoptics unit 1629 can comprise a plurality of microlenses, such asmicrooptics 1623 and microoptics 1627, attached to a substrate. Amicrolens can be a small lens or one that is smaller (e.g., a lens witha diameter less than 1 mm) than a conventional lens. In some examples,the microlenses can be any type of lens and can include any type ofmaterial conventionally used in lenses. In some examples, two or more ofthe microlenses can have the same optical and/or physical properties.One skilled in the art would appreciate that the same optical propertiesand the same physical properties can include tolerances that result in a15% deviation. Light 1654 can transmit through microoptics 1623 and canbe incident on detector pixel 1633. In some examples, microoptics unit1629 can be coupled to one or more aperture planes. In some examples,microoptics unit 1629 can be coupled to a patterned aperture, such as anaperture where locations between adjacent microoptics are opaque toprevent light mixing.

Detector pixel 1633 can be included in detector array 1630. Detectorarray 1630 can include a plurality of detector pixels, such as detectorpixel 1633 and 1637. In some examples, detector array 1630 can be asingle detector pixel detector. In some examples, at least one detectorpixel can be independently controlled from other detector pixelsincluded in detector array 1630. In some examples, at least one detectorpixel can be capable of detecting light in the SWIR. In some examples,at least one detector pixel can be a SWIR detector capable of operatingbetween 2.2-2.7 μm. In some examples, at least one detector pixel can bea HgCdTe, InSb, or InGaAs based detector. In some examples, at least onedetector pixel can be capable of detecting a path length, angle ofincident, and/or exit location of the incoming light beam. Detectorpixel 1633 can detect light 1654 and can generate an electrical signalindicative of the properties of light 1654. Detector array 1630 cantransmit the electrical signal to controller 1640. Controller 1640 canprocess and/or store the electrical signal.

System 1600 can determine the concentration and type of substance insample 1620 by utilizing the information from light traveling throughthe sample in conjunction with the information from light reflecting offreflector 1622. Light source 1602 can emit light 1664, which can reflectoff reflector 1622. Reflector 1622 can include any type of materialcapable of at least partially reflecting light. Exemplary reflectivematerials can include, but are not limited to, Ti, Co, Nb, W, NiCr, TiW,Cr, Al, Au, and Ag. The thickness of reflector 1622 can be determinedbased on the wavelength of light, type of material, and/or composition.In some examples, the size and shape of reflector 1622 can be configuredto be larger or the same size and/or shape of the light beam included inlight 1664. One skilled in the art would appreciate that the same sizeand the same shape can include tolerances that result in a 15%deviation. In some examples, reflector 1622 can be configured to reflectgreater than 75% of light 1764. In some examples, reflector 1622 can beconfigured to reflect greater than 90% of light 1764. In some examples,the size and shape of reflector 1622 can be such that no or a minimal(e.g., less than 10%) amount of light 1664 is allowed to transmitthrough the reflector 1622, and light 1664 is prevented from travelingthrough sample 1620. In some examples, reflector 1622 can be configuredto reflect light 1664 as a specular reflection. In some examples,reflector 1622 can be a spectroscopically neutral blocker. In someexamples, the reference can be formed by chopping light 1664 between thesample 1620 and reference (e.g., reflector 1622).

Light 1664 can reflect off reflector 1622 towards optics 1616. Light1664 can transmit through optics 1616 towards aperture 1686. In someexamples, the path length of light 1664 can be a known value, soaperture 1686 can be configured to include opening 1689, whose size andshape can allow light 1664 to transmit through. Light 1664 exitingaperture plane 1668 can be incident on optics 1618. Light 1664 cantransmit through optics 1618 and can be incident on optics 1619. Optics1619 can be any type of optics configured for spreading out the incominglight beam. In some examples, optics 1619 can be a negative lens, whichcan be a lens with a focal length that is negative. In some examples,optics 1619 can be a prism. In some examples, optics 1619 can include adifferent prism wedge angled for each detector pixel included indetector array 1630. In some examples, system 1600 can be configuredwith a beamsplitter for spreading out the incoming light beam. In someexamples, optics 1619 can be configured to spread out or divide lightinto multiple beams, such as light 1666 and light 1667. In someexamples, optics 1619 can spread out light such that each light beam isdirected to a different detector pixel included in detector array 1630.In some examples, optics 1619 can uniformly spread out light such thatone or more optical properties of each light beam are the same. Oneskilled in the art would appreciate that the same optical properties caninclude tolerances that result in a 15% deviation. In some examples,optics 1619 can spread out the light beam such that intensities of atleast two light beams are different. In some examples, optics 1619 cancomprise multiple optics or microoptics. In some examples, the sizeand/or size of optics 1619 can be based on the number of detector pixelsand/or the properties of the one or more light beams exiting optics1619. In some examples, an aperture can be coupled to optics 1619 tocontrol the properties and/or direction of light exiting optics 1619. Insome examples, optics 1619 or system 1600 can be configured such thatlight that reflects off a surface of sample 1620 or an edge of system1600 reflects back into the system (i.e., light that has not traveledthrough sample 1620) and is prevented from being incident on optics1619, although stray light or background light can be incident on optics1619.

Light 1664 can transmit through optics 1619 to form light 1666. Light1666 can be incident on detector pixel 1633. Detector pixel 1633 candetect light 1666 and can generate an electrical signal indicative ofthe properties of light 1666. Detector array 1630 can transmit theelectrical signal controller 1640. Controller 1640 can process and/orstore the electrical signal. Controller 1640 can utilize the signalinformation measured from light 1654 to determine the reflectivity orconcentration of the substance at location 1657 and can utilize thesignal information from light 1666 to determine the properties ofreflector 1622. Using any of the above discussed methods, controller1640 can process both signal information to determine the concentrationand type of substance at location 1657.

Similar to measuring the concentration and type of one or moresubstances at location 1657, the same components can be used to measurethe concentration and type of one or more substances at location 1659.Light source 1602 can emit light 1650, which can exit system 1600 atinput region 1682 to form light 1653. In some examples, system 1600 caninclude multiple apertures. For example, system 1600 can include atleast two apertures, where light 1652 can exit one aperture and light1653 can exit another aperture. Light 1653 can be incident on location1659 and can reflect back into system 1600 as light 1655. Light 1655 canenter system 1600 through optics 1610 at location 1617. Light 1655 cantransmit through optics 1616 and can be incident on aperture 1686.Aperture 1686 can include opening 1687 configured to allow light 1655(and any light with the same path length as light 1655) to transmitthrough. One skilled in the art would appreciate that the same pathlength can include tolerances that result in a 15% deviation. In someexamples, since location 1657 can be located at depth 1661, differentfrom depth 1663 of location 1659, aperture 1686 can include at least twoapertures with different aperture sizes. For example, opening 1685 canbe configured with an aperture size based on the path length of light1654, and opening 1687 can be configured with an aperture size based onthe path length of light 1655. Light 1655 can transmit through opening1687, can transmit through optics 1618, and can be incident onmicrooptics 1627. Light 1655 can transmit through microoptics 1627 andcan be detected by detector pixel 1637, included in detector array 1630.Detector pixel 1637 can detect light 1655 and can generate an electricalsignal indicative of the properties of light 1655. Detector array 1630can transmit the electrical signal can be transmitted to controller1640, and controller 1640 can process and/or store the electricalsignal.

Controller 1640 can utilize the signal information measured from light1655 to determine the reflectivity or concentration of the substance atlocation 1659 and can utilize the signal information from light 1667 todetermine the properties of reflector 1622. Controller 1640 can processboth signal information to determine the concentration of the substanceat location 1659. In some examples, controller 1640 can determine theproperties of reflector 1622 (or light 1666 incident on detector pixel1633) and light 1667 incident on detector pixel 1637 simultaneouslywithout the need for separate measurements. In some examples, location1657 and location 1659 can have the same depth from a surface of thesample 1620. One skilled in the art would appreciate that the same depthcan include tolerances that result in a 15% deviation. In some examples,location 1657 and location 1659 can have different depths from thesurface of the sample 1620. Controller 1640 can measure thereflectivity, refractive index, density, concentration, scatteringcoefficient, scattering anisotropy, absorbance, or any combination ofoptical properties at both location 1657 and location 1659 and canaverage the measured values. Although the figure and discussion aboverelates to two locations in the sample, examples of the disclosure caninclude any number of locations and are not limited to one or twolocations.

As illustrated in the figure, system 1600 can include a plurality ofapertures, a plurality of microoptics, and a plurality of detectorpixels, where each aperture and microoptics can be coupled to a detectorpixel. In some examples, each aperture-microoptics-detector pixel triocan be associated with a location in the sample. In some examples, theassociation can be one aperture-microoptics-detector pixel trio to onelocation in the sample. For example, opening 1685, microoptics 1623, anddetector pixel 1633 can be associated with location 1657. Similarly,opening 1687, microoptics 1627, and detector pixel 1637 can beassociated with location 1659. Since controller 1640 can associatedetector pixel 1633 and detector pixel 1637 to the different locations(e.g., location 1657 and location 1659) in sample 1620, controller 1640can determine and locate different concentrations of the substance fordifferent locations within sample 1620. In some examples, differentsubstances can be located in the different locations and controller 1640can associate the locations to the different substances.

In some examples, system 1600 can be polarization sensitive. For somesamples, polarized light incident on the sample can reflect strongly offthe surface of the sample without undergoing a significant change inpolarization. In some examples, this reflected light can be largelyspecular. In contrast, polarized light that enters the sample andreflects off one or more layers can have an initial polarization whenincident on the sample, but can become progressively depolarized byscattering from one or more substances in the sample. The degree ofpolarization can be used to determine the depth that light travels inthe sample prior to backscattering. The depth that light travels in thesample prior to backscattering can be used to estimate the path lengthof the optical path. In some examples, the path length of the opticalpath can be equal to two times the scattering depth. In some examples,the degree of polarization of light that travels through the sample andreflects back can also provide information about the nature of thesample.

In some examples, system 1600 can be configured to measure the change inpolarization state by including one or more polarizing filters. A firstpolarizing filter can be located between light source 1602 and sample1620, and a second polarizing filter can be located between sample 1620and detector 1630. In some examples, the second polarizing filter can bedifferent from the first polarizing filter in that the second polarizingfilter can be configured to block out polarized light with apolarization that the first polarizing filter transmits through. In sucha manner, light reflected off the surface of sample 1620 can bespatially separated from reflected off a location in sample 1620.

FIG. 16B illustrates a cross-sectional view of an exemplary polarizationsensitive system according to examples of the disclosure. System 1601can include one or more of the components included in system 1600,discussed above and illustrated in FIG. 16A. System 1601 can furtherinclude beamsplitter 1606 and detector 1632. Beamsplitter 1606 can splitlight 1655 into two light paths, one light path can be measured bydetector pixel 1637 included in detector array 1630, and the other lightpath can be measured by detector 1632. Detector pixel 1637 can beconfigured to measure a different polarization than detector 1632. Forexample, detector pixel 1637 can be configured to measurep-polarization, whereas detector 1632 can be configured to measures-polarization.

In some examples, beamsplitter 1606 can be a polarizing beamsplitter.S-polarized light can reflect off a surface of beamsplitter 1606 and canbe detected by detector 1632. In some examples, detector 1632 caninclude a wire grid polarizer located on its surface. In some examples,detector 1630 can include a wire grid polarizer located on the surface.P-polarized light can transmit through beamsplitter 1606 and can bedetected by detector pixel 1637. Based on the ratio of s-polarized light(e.g., light detected by detector 1632) and p-polarized light (e.g.,light detected by detector pixel 1637), the concentration and type ofone or more substances in the sample can be determined.

In some examples, specular reflectance from light that has not traveledinto the sample can be excluded or removed from the measurements byconfiguring light 1653 to have an angle of incidence at location 1659different from the angle of the incidence of scattered light 1655 atlocation 1617. In some examples, the specular reflectance can bediscarded by directing light onto a black absorbing material (e.g.,black mask). In some examples, system 1601 can include a polarizerlocated between location 1659 and detector pixel 1637. The polarizer canbe configured to exclude light having one or more polarizations.

In some examples, the amount of scattering can depend on the size of thescattering objects in the sample. As a result, the amount of scatteringand the peak scattering angle can be a function of wavelength. Forexample, at 1.5-2.5 μm, a large percentage of light (e.g., greater than30%) scattered from the sample can have a scattering angle between40-60°. The scattering angle can be related to the size of one or moresubstances located in the sample. By associating the scattering angleswith the size of one or more substances located in the sample, differenttypes of substances in the sample can be identified and distinguished.In some examples, system 1601 can include a wide wavelength band (e.g.,greater than 1200 nm spectral range) antireflective (AR) coating inorder to detect light with a scattering angle between 40-60°. In someexamples, system 1601 can include one or more masking materials to limitthe range of scattering angles detected by the system 1601.

FIG. 17 illustrates a cross-sectional view of an exemplary systemconfigured to determine a concentration and type of one or moresubstances located within a sample according to examples of thedisclosure. In some examples, the one or more substances of interest canhave a low concentration (e.g., more than one order of magnitude less)in the sample than other substances of interest. In some examples, theconcentration of the one or more substances can lead to a low SNR (i.e.,SNR<10⁻⁴ or 10⁻⁵). Sample 1720 can include one or more locations, suchas location 1757 and location 1759, where one or more substances can bemeasured.

System 1700 can be close to, touching, resting on, or attached to sample1720. In some examples, system 1700 can be a compact, portableelectronic device. Compact, portable electronic devices can havestringent size requirements due to the increasing demand for smaller,thinner, and lighter design that are more user-friendly andaesthetically appealing. To implement the functionality of the abovedisclosed examples, system 1700 can include components such as lightsource 1702, microoptics unit 1729, detector array 1730, and controller1740. One or more components or optics can be eliminated by integratingthe features into other components or optics and by placing theintegrated components closer to a surface of the sample or an edge ofthe system.

Light source 1702 can be configured to emit light 1752. Light source1702 can be any source capable of generating light including, but notlimited to, a lamp, laser, LED, OLED, EL source, super-luminescentdiode, super-continuum source, fiber-based source, or a combination ofone or more of these sources. In some examples, light source 1702 can becapable of emitting a single wavelength of light. In some examples,light source 1702 can be capable of emitting a plurality of wavelengthsof light. In some examples, light source 1702 can be any tunable sourcecapable of generating a SWIR signature. Light source 1702 can includeone or more components for emitting multiple light beams, such as light1752 and light 1753, directed at different apertures, such as inputregion 1782 and input region 1791. Input region 1782 and input region1791 can be located close to or near sample 1720 or an edge of thesystem 1700. System 1700 can also include one or more apertures, such asinput region 1782, input region 1791, output region 1793, and outputregion 1795, and each aperture can be comprise one or more transparentcomponents including, but not limited to, a window, optical shutter, andmechanical shutter.

Light 1752 can exit system 1700 through input region 1782. Light 1752can penetrate through sample 1720 and can be incident on location 1757.Light 1752 can have any angle of incidence at location 1757 including,but not limited to, 45°. In some examples, light 1752 can be acollimated beam. Location 1757 can include a concentration of thesubstance of interest. Light 1752 can be partially absorbed at location1757 and can be partially reflected as light 1754. In some examples,light 1754 can be formed by light transmitting through the sample. Light1754 can penetrate through sample 1720 and can enter system 1700 throughoutput region 1793.

Light 1754 can be incident on microoptics 1723 of microoptics unit 1729.Microoptics unit 1729 can comprise a plurality of microoptics, such asmicrooptics 1723 and 1727, attached to a substrate. In some examples,the microoptics can be any type of lens and can include any type ofmaterial conventionally used in lenses. In some examples, two or more ofthe microoptics included in the microoptics unit 1729 can have the sameoptical and/or physical properties. One skilled in the art wouldappreciate that the same optical properties and the same physicalproperties can include tolerances that result in a 15% deviation. Light1754 can transmit through microoptics 1723 and can be incident ondetector pixel 1733 of detector array 1730. In some examples,microoptics unit 1729 can be coupled to one or more apertures orapertures. In some examples, microoptics unit 1729 can be coupled to apatterned aperture, such as an aperture where locations between adjacentmicrooptics are opaque to prevent light mixing.

Detector pixel 1733 can be included in detector array 1730. Detectorarray 1730 can include a plurality of detector pixels, such as detectorpixels 1733 and 1737. In some examples, detector array 1730 can be asingle pixel detector. In some examples, at least one detector pixel canbe independently controlled from other detector pixels in the detectorarray 1730. In some examples, at least one detector pixel can be capableof detecting light in the SWIR. In some examples, at least one detectorpixel can be a SWIR detector capable of operating between 2.2-2.7 μm. Insome examples, at least one detector pixel can be a HgCdTe, InSb, orInGaAs based detector. In some examples, at least one detector pixel canbe capable of detecting a position and/or angle of the incoming lightbeam. Detector pixel 1733 can detect light 1754 and can generate anelectrical signal indicative of the properties of light 1754. Detectorarray 1730 can transmit the electrical signal to controller 1740, whichcan process and/or store the electrical signal.

Light source 1702 can also emit light 1764 to measure the opticalproperties of reflector 1722. Reflector 1722 can comprise any type ofmaterial, such as Ti, Co, Nb, W, NiCr, TiW, Cr, Al, Au, and Ag, capableof partially reflecting or reflecting a large percentage of light. Thethickness of reflector 1722 can be determined based on the wavelength oflight, type of material, and/or composition. In some examples, the sizeand shape of reflector 1722 can be configured to be larger or the samesize and/or shape of light 1764. One skilled in the art would appreciatethat the same size and the same shape can include tolerances that resultin a 15% deviation. In some examples, the reflector 1722 can beconfigured to reflect greater than 75% of light. In some examples, thereflector 1722 can be configured to reflect greater than 90% of light.In some examples, the size and shape of reflector 1722 can be such thatno or minimal (e.g., less than 10%) amounts of light 1764 is allowed totransmit through reflector 1722, and light 1764 is prevented frompenetrating through sample 1720. In some examples, reflector 1722 can beconfigured to reflect light 1764 as a specular reflection. In someexamples, reflector 1722 can be a spectroscopically neutral blocker. Insome examples, the reference can be formed by chopping light 1764between sample 1720) and the reference (e.g., reflector 1722).

Light 1764 can reflect off reflector 1722 towards optics 1719. Optics1719 can be any type of optics configured for spreading out the incominglight beam. In some examples, optics 1719 can be a negative lens, whichcan be a lens with a focal length that is negative. In some examples,optics 1719 can be a prism. In some examples, optics 1719 can include adifferent prism wedge angled for each detector pixel included in thedetector array 1730. In some examples, system 1700 can be configuredwith a beamsplitter for spreading out the incoming light beam. In someexamples, optics 1719 can be configured to spread out or divide lightinto multiple beams, such as light 1766 and 1767. In some examples,optics 1719 can spread out light such that each light beam is directedto a different detector pixel included in the detector array 1730. Insome examples, optics 1719 can uniformly spread out light such that eachlight beam has one or more optical properties that are the same. Oneskilled in the art would appreciate that the same optical properties caninclude tolerances that result in a 15% deviation. In some examples,optics 1719 can spread out the light beam such that intensities of atleast two light beams are different. In some examples, optics 1719 cancomprise multiple optics or microoptics. In some examples, the sizeand/or size of optics 1719 can be based on the number of detector pixelsand/or the properties of the one or more light beams exiting optics1719. In some examples, an aperture can be coupled to optics 1719 tocontrol the properties and/or direct light exiting optics 1719. In someexamples, optics 1719 or system 1700 can be configured such that lightthat reflects off a surface of sample 1720 or an edge of system 1700reflects back into the system (i.e., light that has not traveled throughsample 1720) and is prevented from being incident on optics 1719,although stray light or background light can be incident on optics 1719.

Light 1764 can transmit through optics 1719 to form light 1766. Light1766 can be incident on detector pixel 1733. Detector pixel 1733 candetect light 1766 and can generate an electrical signal indicative ofthe properties of light 1766. Detector array 1730 can transmit theelectrical signal to controller 1740, which can process and/or store theelectrical signal. Controller 1740 can utilize the signal informationmeasured from light 1754 to determine the reflectivity or concentrationof the substance at location 1757 and can utilize the signal informationfrom light 1766 to determine the properties of reflector 1722. Using anyof the above discussed methods, controller 1740 can process both signalinformation to determine the concentration of the substance at location1757.

Similar to measuring the concentration of the substance at location1757, the same components can be used to measure the concentration ofthe substance at location 1759. Light source 1702 can emit light 1753,which can exit system 1700 at input region 1791. Light 1753 can beincident on location 1759 and can reflect back into system 1700 as light1755. Light 1755 can enter system 1700 at output region 1795. Light 1755can be incident on microoptics 1727, included in microoptics unit 1729.Light 1755 can transmit through microoptics 1727 and can be incident ondetector pixel 1737, included in detector array 1730. Detector pixel1737 can detect light 1755 and can generate an electrical signalindicative of the properties of light 1755. Detector array 1730 cantransmit the electrical signal to controller 1740, which can processand/or store the electrical signal. Controller 1740 can utilize thesignal information measured from light 1755 to determine thereflectivity or concentration of the substance at location 1759 and canutilize the signal information from light 1767 to determine theproperties of reflector 1722. Controller 1740 can process both signalinformation to determine the concentration of the substance at location1759 located in sample 1720. In some examples, controller 1740 candetermine the properties of reflector 1722 (or light 1766 incident ondetector pixel 1733) and light 1767 incident on detector pixel 1737simultaneously without the need for separate measurements. Controller1740 can measure the reflectivity, refractive index, density,concentration, scattering coefficient, scattering anisotropy,absorbance, or a combination of these optical properties at bothlocation 1757 and location 1759 and can average the measured values.Although the figure and discussion above relates to two locations in thesample, examples of the disclosure can include any number of locationsand are not limited to one or two locations.

As illustrated in the figure, system 1700 can include a plurality ofmicrooptics and a plurality of detector pixels, where each microopticscan be coupled to a detector pixel. Each microoptics-detector pixel paircan be associated with a location in the sample. In some examples, theassociation can be one microoptics-detector pixel pair to one locationin the sample. For example, microoptics 1723 and detector pixel 1733 canbe associated with location 1757. Microoptics 1727 and detector pixel1737 can be associated with location 1759. Since controller 1750 canassociate detector pixel 1733 and detector pixel 1737 to the differentlocations (e.g., location 1757 and location 1759) within the sample,controller 1750 can determine and locate different concentrations of thesubstance for different locations in sample 1720.

FIG. 18 illustrates a top view of an exemplary system configured tomeasure one or more substances located within a sample according toexamples of the disclosure. System 1800 can be close to, touching,resting on, or attached to the sample. System 1800 can be segmented intoa plurality of units 1899. Each unit 1899 can comprise one or morereflectors 1822 and a plurality of apertures 1882. Reflector 1822 caninclude any type of material capable of at least partially reflectinglight. In some examples, reflector 1822 may not be visible from the topview, but can be placed in the same location as indicated by the figure.

One or more of the plurality of apertures 1882 can be configured toallow light to enter or exit the top surface of system 1800. One or moreoptical components, such as a light source, lens, microlens, detectorpixel, or detector array, can be located close to, below, or above oneor more of the plurality of apertures 1882. In some examples, apertures1882 and/or reflector 1822 can be circular in shape or can be a metaldot. In some examples, apertures 1882 and reflector 1822 can beseparated by a gap or an optical isolation material to prevent lightmixing. Although the figure illustrates the plurality of apertures 1882as arranged in a column and row format with reflector 1822 located onone side of unit 1899, the plurality of apertures 1882 can be arrangedin any manner. For example, reflector 1822 can be located in the centerand can be associated with surrounding apertures 1882 and correspondingcomponents. In some examples, reflector 1822 can be associated withthose optical components located in the same unit 1899. For example, thereference measurement from reflector 1822 can be distributed by anegative lens (or prism or beamsplitter) to the optical components inthe same unit 1899. In some examples, each input or output region 1882can be associated with a lens or microlens. The size and/or shape of theinput or output region 1882 or lens or both can be based on location ofthe associated detector pixel in a detector array. In some examples,each input or output region 1882 can be associated with a depth belowthe surface of the sample and/or the angle of incidence of incominglight.

In some examples, due to the small size of the apertures, any of theabove disclosed systems can include on 10-100 apertures and reflectors.For example, each aperture can have a diameter of 100-900 μm, and eachunit can have a length (or width) of around 5 mm With a large number ofapertures and reflectors, the system can measure a plurality oflocations within the sample. In some examples, a plurality of aperturescan be configured to measure locations with the same depth, and thecontroller can have a sufficient number of values to average to accountfor the inhomogeneity that can exist along different locations withinthe sample. One skilled in the art would appreciate that the same depthcan include tolerances that result in a 15% deviation. In some examples,a plurality of apertures can be configured to measure locations withdiffering depths, and the system can account for inhomogeneity that canexist along the depth of sample. In some examples, a first set ofapertures can be configured to measure a first substance, and a secondset of apertures can be configured to measure a second substancedifferent from the first substance.

FIG. 19 illustrates a top view of an exemplary system configured tomeasure a concentration and type of one or more substances locatedwithin a sample according to examples of the disclosure. System 1900 canbe close to, touching, resting on, or attached to the sample. System1900 can be segmented into a plurality of units 1999. Each unit 1999 cancomprise one or more reflectors 1922 and a plurality of input or outputregions 1982. Reflector 1922 can include any type of material capable ofat least partially reflecting light. In some examples, reflector 1922may not be visible from the top view, but can be placed in the samelocation as indicated by the figure. One skilled in the art wouldappreciate that the same location can include tolerances that result ina 15% deviation.

One or more of the plurality of input or output regions 1982 can beconfigured to allow light to enter or exit the top surface of system1900. One or more optical components, such as a light source, lens,microlens, detector, or detector array, can be located close to, below,or above one or more of the plurality of input or output regions 1982.System 1900 can have the same components as system 1800, but arranged asa grid of squares. In some examples, input or output regions 1982 andreflector 1922 can be separated by a gap or an optical isolationmaterial to prevent light mixing. In some examples, reflector 1922 canbe associated with input or output regions 1982 and correspondingoptical components within the same unit 1999.

Although some of the examples described and illustrated above werediscussed separately, one skilled in the art would understand that oneor more of the examples can be combined and included into a singlesystem and/or method. For example, although system 1500 (illustrated inFIG. 15 ) includes light blocker 1592 and system 1600 (illustrated inFIGS. 16A-16B) includes aperture 1686, both examples can be combined andincluded in a single system.

One or more of the functions described above can be performed, forexample, by firmware stored in memory and executed by a processor orcontroller. The firmware can also be stored and/or transported withinany non-transitory computer-readable storage medium for use by or inconnection with an instruction execution system, apparatus, or device,such as a computer-based system, processor-containing system, or othersystem that can fetch the instructions from the instruction executionsystem, apparatus, or device and execute the instructions. In thecontext of this document, a “non-transitory computer-readable storagemedium” can be any medium (excluding a signal) that can contain or storethe program for use by or in connection with the instruction executionsystem, apparatus, or device. The non-transitory computer readablestorage medium can include, but is not limited to, an electronic,magnetic, optical, electromagnetic, infrared, or semiconductor system,apparatus, or device, a portable computer diskette (magnetic), a randomaccess memory (RAM) (magnetic), a read-only memory (ROM) (magnetic), anerasable programmable read-only memory (EPROM) (magnetic), a portableoptical disc such as a CD, CD-R, CD-RW, DVD, DVD-R, or DVD-RW, or flashmemory such as compact flash cards, secured digital cards, USB memorydevices, memory sticks and the like. In the context of this document, a“transport medium” can be any medium that can communicate, propagate, ortransport the program for use by or in connection with the instructionexecution system, apparatus, or device. The transport readable mediumcan include, but is not limited to, an electronic, magnetic, optical,electromagnetic, or infrared wired or wireless propagation medium.

As discussed above, examples of the disclosure can include measuring aconcentration of a substance in a sample at a sampling interface. Insome examples, the sample can include at a least a portion of a user,where additional information can be used to improve the delivery ofmeasured information, analysis, or any other content that may be ofinterest to the users. In some examples, the measured information,analysis, or other content may include personal information such asinformation that can uniquely identify the user (e.g., can be used tocontact or locate the user). In some examples, personal information caninclude geographic information, demographic information, telephonenumbers, email addresses, mailing addresses, home addresses, or otheridentifying information. Use of such personal information can be used tothe benefit of the user. For example, the personal information can beused to deliver the measured information, analysis, or other content tothe user. Use of personal information can include, but is not limitedto, enabling timely and controlled delivery of the measured information.

The disclosure also contemplates that an entity that may be measuring,collecting, analyzing, disclosing, transferring, and/or storing thepersonal information will comply with well-established privacy policiesand/or practices. These privacy policies and/or practices can begenerally recognized as meeting (or exceeding) industry or governmentalrequirements for private and secure personal information and should beimplemented and consistently used. For example, personal informationshould be collected for legitimate and reasonable purposes (e.g., todeliver the measured information to the user) and should not be shared(e.g., sold) outside of those purposes. Furthermore, collected personalinformation should occur only after receiving the informed consent ofthe user(s). To adhere to privacy policies and/or practices, entitiesshould take any steps necessary for safeguarding and securing outsideaccess to the personal information. In some examples, entities cansubject themselves to third party evaluation(s) to certify that theentities are adhering to the well-established, generally recognizedprivacy policies and/or practices.

In some examples, the user(s) can selectively block or restrict accessto and/or use of the personal information. The measurement system caninclude one or more hardware components and/or one or more softwareapplications to allow the user(s) to selective block or restrict accessto and/or use of the personal information. For example, the measuringsystem can be configured to allow users to “opt in” or “opt out” ofadvertisement delivery services when collecting personal informationduring registration. In some examples, a user can select whichinformation (e.g., geographical location) to provide and whichinformation (e.g., phone number) to exclude.

Although examples of the disclosure can include systems and method formeasuring a concentration of a substance with the use of the user'spersonal information, examples of the disclosure can also be capable ofone or more functionalities and operation without the user's personalinformation. Lack of all or a portion of the personal information maynot render the systems and methods inoperable. In some examples, contentcan be selected and/or delivered to the user based on non-user specificpersonal (e.g., publicly available) information.

In some examples, a system for measuring a concentration of a substancein a sample at a sampling interface is disclosed. The system maycomprise: a light source configured to emit a first light including oneor more wavelengths; one or more optics; one or more modulatorsconfigured to modulate at least a portion of the first light, the one ormore modulators located between the one or more optics and the samplinginterface; a reference comprising one or more spectroscopic properties;a first detector configured to detect the at least portion of the firstlight; and logic configured to: send one or more first signals to thelight source, and receive one or more second signals from the firstdetector. Additionally or alternatively to one or more examplesdisclosed above, in some examples, the one or more modulators includesan optical chopper located between the light source and the samplinginterface or reference. Additionally or alternatively to one or moreexamples disclosed above, in some examples, the reference is at leastone of a neutral density filter, blank attenuator, and a reflector.Additionally or alternatively to one or more examples disclosed above,in some examples, the reference is a reflector made of at least one ofTitanium (Ti), Cobalt (Co), Niobium (Nb), Tungsten (W), Nickel Chrome(NiCr), Titanium Tungsten (TiW), Chrome (Cr), Aluminum (Al), Gold (Au),and Silver (Ag). Additionally or alternatively to one or more examplesdisclosed above, in some examples, the reference is a reflectorconfigured with a size that is greater than or equal to a size of thefirst light emitted from the light source. Additionally or alternativelyto one or more examples disclosed above, in some examples, the referenceis a reflector that includes a metal dot. Additionally or alternativelyto one or more examples disclosed above, in some examples, the referenceis a specular reflector. Additionally or alternatively to one or moreexamples disclosed above, in some examples, the reference is a reflectorand a portion of the first light is incident on the reflector.Additionally or alternatively to one or more examples disclosed above,in some examples, the system further comprises a filter, the filterincluding at least one of an acousto-optic tunable filter (AOTF), angletunable narrow bandpass filter, or a plurality of sub-filters, eachsub-filter having a different spectral range, located between the lightsource and the beamsplitter, the filter configured to select one or morediscrete wavelengths from the one or more wavelengths of the first lightemitted from the light source. Additionally or alternatively to one ormore examples disclosed above, in some examples, an edge of the systemis located at a sample-system interface, and further wherein the one ormore optics includes a silicon objective lens, the silicon objectivelens configured to collect a reflection of at least a portion of thefirst light at the sample-system interface. Additionally oralternatively to one or more examples disclosed above, in some examples,the first detector includes a plurality of detector pixels, and furtherwherein the one or more optics includes a optics configured fordistributing a portion of the first light to one or more of theplurality of detector pixels. Additionally or alternatively to one ormore examples disclosed above, in some examples, the first optics is atleast one of a negative lens, prism, and beamsplitter. Additionally oralternatively to one or more examples disclosed above, in some examples,distributing the portion of the first light comprises splitting theportion of the first light into multiple light beams, each light beamdirected to a different detector pixel included a set of the pluralityof detector pixels. Additionally or alternatively to one or moreexamples disclosed above, in some examples, each detector pixel of theset of the plurality of detector pixels is associated with differentlocations in the sample, each location having a same path length withinthe sample. Additionally or alternatively to one or more examplesdisclosed above, in some examples, each detector pixel included in theset of plurality of detector pixels is associated with different pathlengths in the sample. Additionally or alternatively to one or moreexamples disclosed above, in some examples, distributing a portion ofthe first light comprises splitting the portion of the first light intomultiple light beams, at least one of the multiple light beamsconfigured to have one or more properties that is same as another of themultiple light beams. Additionally or alternatively to one or moreexamples disclosed above, in some examples, the one or more opticsincludes a microoptics unit, the microoptics unit comprising a pluralityof microlenses. Additionally or alternatively to one or more examplesdisclosed above, in some examples, the sample comprises a plurality oflocations, and further wherein the first detector comprises a pluralityof detector pixels, each detector pixel associated with one of theplurality of microoptics and one of the plurality of locations.Additionally or alternatively to one or more examples disclosed above,in some examples, the first detector is configured to measure short-waveinfrared (SWIR) in at least a portion of 1.4-2.7 μm. Additionally oralternatively to one or more examples disclosed above, in some examples,the first detector is configured to measure short-wave infrared (SWIR)in at least a portion of 2.2-2.7 μm. Additionally or alternatively toone or more examples disclosed above, in some examples, the firstdetector is a HgCdTe, InSb, or InGaAs based detector. Additionally oralternatively to one or more examples disclosed above, in some examples,the system further comprises a light blocking material capable ofabsorbing or blocking light reflected from an edge of the system.Additionally or alternatively to one or more examples disclosed above,in some examples, the logic is further configured to: determine whetherthe received one or more second signals match a spectral fingerprint ofthe substance; and determine the concentration of the substance at thesampling interface based on the match of the spectral fingerprint.Additionally or alternatively to one or more examples disclosed above,in some examples, the one or more optics includes a beamsplitterconfigured to split at least a portion of the first light emitted fromthe light source into multiple beams comprising at least a second lightand a third light. Additionally or alternatively to one or more examplesdisclosed above, in some examples, the system further comprises a seconddetector configured to detect a first polarization of the third light,wherein the first detector is configured to detect a second polarizationof the second light, the second polarization being different than thefirst polarization.

In some examples, a system for projecting a first image is disclosed.The system comprising: one or more optics configured to reimage thefirst image located on a first plane to a second image located on asecond plane, different from the first plane, at least one of the one ormore optics producing an intermediate plane of focus located between thefirst plane and the second plane, wherein the first image includes aplurality of concentration values. Additionally or alternatively to oneor more examples disclosed above, in some examples, the second imageincludes a magnification of the first image. Additionally oralternatively to one or more examples disclosed above, in some examples,the one or more optics is capable of selecting a first light with a samepath length as a pre-determined path length or within a range ofpre-determined path lengths and rejecting a second light with pathlength different from the pre-determined path length or outside therange of pre-determined path lengths. Additionally or alternatively toone or more examples disclosed above, in some examples, the systemfurther comprises an aperture, the aperture comprising one or moreaperture, each aperture configured to select the fourth light and rejectthe fifth light. Additionally or alternatively to one or more examplesdisclosed above, in some examples, the aperture comprises at least twoapertures of different sizes.

In some examples, a method for measuring a concentration of a substancein a sample at a sampling interface, the method comprising: during acalibration phase: deactivating a light source and a modulator,determining a level by detecting with a detector an amount of darkcurrent or stray light or both, and setting a zero level equal to thelevel; and during a measurement phase: measuring an absorbance,reflectance, or transmittance value in a same location of the samplinginterface to determine an optical value; measuring an absorbance,reflectance, or transmittance value in a reference to determine areference optical value, and dividing the optical value by the referenceoptical value to obtain a sampling point, repeating the determination ofthe optical value and the determination of the reference optical valueto obtain a plurality of sampling points, and averaging the plurality ofsampling points to determine the concentration of the substance at thesampling interface, wherein the number of plurality of sampling pointswithin a continuous measurement phase is less than 100. Additionally oralternatively to one or more examples disclosed above, in some examples,the number of plurality of sampling points is less than or equal to 10.Additionally or alternatively to one or more examples disclosed above,in some examples, the method further comprises a plurality of frames,each frame include one calibration phase and one measurement phase, andwherein determining the concentration of the substance at the samplinginterface comprising averaging the plurality of sampling points from atleast two of the plurality of frames. Additionally or alternatively toone or more examples disclosed above, in some examples, a duration ofthe measurement phase is based on a stability of at least one of thelaser and the detector. Additionally or alternatively to one or moreexamples disclosed above, in some examples, the duration of themeasurement phase is less than 60 seconds. Additionally or alternativelyto one or more examples disclosed above, in some examples, the method iscapable of accounting for zero drift and gain drift from both the lightsource and the detector. Additionally or alternatively to one or moreexamples disclosed above, in some examples, the method is capable ofremoving stray light. Additionally or alternatively to one or moreexamples disclosed above, in some examples, determining the referenceoptical value comprises modulating light between the sample and thereference. Additionally or alternatively to one or more examplesdisclosed above, in some examples, the measurement phase includes aplurality of optical values and a plurality of reference optical values,and further wherein the plurality of optical values and the plurality ofreference optical values are measured at different times within themeasurement phase.

Although the disclosed examples have been fully described with referenceto the accompanying drawings, it is to be noted that various changes andmodifications will become apparent to those skilled in the art. Suchchanges and modifications are to be understood as being included withinthe scope of the disclosed examples as defined by the appended claims.

What is claimed is:
 1. A system for taking a measurement, comprising: alight source configured to output light to a sample; a lens located atan interface of the system and configured to receive a first portion ofthe light from a first location within the sample and a second portionof the light from a second location within the sample; a microlensarray, comprising: a first microlens configured to receive the firstportion of the light from the lens and direct the first portion of thelight to the detector; and a second microlens configured to receive thesecond portion of the light from the lens and direct the second portionof the light to the detector.
 2. The system of claim 1, furthercomprising a reference, wherein: the light comprises first light that isoutput to the sample and second light that is output to the reference;and the microlens array further comprises a third microlens configuredto: receive the second light from the reference; and direct the secondlight to the detector.
 3. The system of claim 2, wherein: the detectorincludes a plurality of detector pixels; and the third microlens isconfigured to: split the second light from the reference; and direct thesplit second light to at least two detector pixels of the plurality ofdetector pixels.
 4. The system of claim 2, wherein: the third microlensis a different type of lens than the first microlens and the secondmicrolens; and the third microlens comprises one of a negative lens or aprism wedge.
 5. The system of claim 1, further comprising one or moreinput regions located at the interface of the system; wherein: themicrolens array includes a fourth microlens that configured to: receivethe light from the light source; and direct the light from the lightsource to the one or more input regions.
 6. The system of claim 1,wherein: the detector includes a plurality of detector pixels comprisinga first detector pixel and a second detector pixel; the first microlensdirects the light from the first location to the first detector pixel;and the second microlens directs the light from the second location tothe second detector pixel.
 7. The system of claim 1, further comprisinga patterned aperture including one or more opaque regions; wherein: atleast one of the one or more opaque regions is located between the firstmicrolens and the second microlens.
 8. The system of claim 1, furthercomprising an optics unit, the optics unit comprising: first optics thatreceives the light from the lens and directs the light from the lens tothe detector; and second optics that receives the light from the lensand directs the light from the lens to the detector.
 9. The system ofclaim 1, further comprising an aperture, the aperture comprising: afirst opening configured to receive the light from the first location;and a second opening configured to receive the light from the secondlocation; wherein: the first opening selectively directs the light fromthe first location to the detector; and the second opening selectivelydirects the light from the second to the detector.
 10. The system ofclaim 1, further comprising a second detector and a beamsplitter,wherein: the beamsplitter splits light from the first location; and atleast a portion of the light split by the beamsplitter is directed tothe second detector.
 11. A method from taking a measurement of a sampleusing a device, comprising: emitting light from the device towards asample interface; receiving at a lens located at an interface of thedevice a first portion of the light from a first location within thesample and a second portion of the light from a second location withinthe sample; directing the first portion of the light from the lens to adetector using a first microlens of a microlens array; and directing thesecond portion of the light from the lens to the detector using a secondmicrolens of the microlens array.
 12. The method of claim 11, wherein:the operation of emitting the light comprises: emitting a first lighttoward the sample interface; and emitting a second light toward areference; and the method further comprises directing the second lightfrom the reference to the detector using an optics.
 13. The method ofclaim 11, further comprising: splitting light received from a reference;and directing the split light to at least two detector pixels includedin the detector.
 14. The method of claim 11, wherein: the detectorincludes a first detector pixel and a second detector pixel; theoperation of directing the first portion of the light from the lenscomprises directing the first portion of the light from the lens to thefirst detector pixel; and the operation of directing the second portionof the light from the lens comprises directing the second portion of thelight from the lens to the second detector pixel.
 15. The method ofclaim 11, further comprising passing the light from the lens through anaperture to the detector.
 16. The method of claim 15, wherein passingthe light through the aperture comprises changing one or more of a pathlength or an angle of incidence of the light.
 17. The method of claim11, wherein the detector is a first detector, the method furthercomprising: splitting the light from the lens using a beamsplitter; anddirecting at least a portion of the split light to a second detector.18. A system for measuring a concentration of a substance in a sample,comprising: a light source configured to output a first light to thesample and a second light to a reference; a lens configured to receive aportion of the first light from a location of the sample; a detectorcomprising: a first detector region; and a second detector region; and amicrolens array comprising: a first microlens configured to receive thefirst light from the output region and direct the light from the outputregion to the first detector region; and a second microlens configuredto receive the second light from the reference and direct the secondlight to the second detector region.
 19. The system of claim 18,wherein: the detector further comprises a third detector region; thelocation is a first location; the lens configured to receive a firstportion of the first light from the first location and receive a secondportion of the first light from a second location of the sample; and themicrolens array further comprises a third microlens configured toreceive the second portion of the first light from lens and direct thesecond portion of the first light to the third detector region.
 20. Thesystem of claim 18, wherein the second optics is configured to: direct afirst portion of the second light to the second detector region; anddirect a second portion of the second light to the first detectorregion.